Research on Requirement Analysis of Electronic Equipment Portable Automatic Test System

被引：0
|
作者：
Lv, Yan-Mei [1 ]
Zhen, Hong-Tao [1 ]
Zhang, Dong [1 ]
Peng, Li-Juan [1 ]
机构：
[1] Machine Technol Res Inst, Shijiazhuang, Peoples R China
来源：
2016 INTERNATIONAL CONFERENCE ON COMPUTER SCIENCE AND INFORMATION SECURITY (CSIS 2016) | 2016年
关键词：
Electronic equipment; Test; portable; Unitization;
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
In order to realize the development demands of electronic equipment testing technology which is "coordinated power, meta-synthesis", this paper deeply analyzes the characteristics of the electronic equipment, and researches the design principles for electronic equipment portable automatic test system ( PATS) and the test requirements of electronic equipment. A set of miniaturized, totalized and unitized PATS designing scheme is proposed, it can effectively promote integrating the support resource and improve the field test diagnosis ability and maneuvering support capability of weapon equipment.
引用
收藏
页码：559 / 563
页数：5
相关论文
共 50 条
  • [21] Research on Automatic Test and Diagnosis Equipment for Communication Controller
    Yu Qingbao
    Chen Guoshun
    Du Pengfei
    Wang Peiyuan
    PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON TEST AUTOMATION & INSTRUMENTATION, VOLS 1 - 4, 2010, : 1229 - 1233
  • [22] Study of automatic test system for equipment based on expert system
    Huang Kaoli
    Lian Guangyao
    Guo Rui
    Jiang Yuhai
    Proceedings of the First International Symposium on Test Automation & Instrumentation, Vols 1 - 3, 2006, : 231 - 234
  • [23] The research on architecture of modular automatic test equipment for general-purpose equipment
    Jia, ZJ
    Wu, GP
    Long, YX
    Chen, GS
    ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings, 2005, : 4507 - 4510
  • [24] AUTOMATIC TEST EQUIPMENT
    BRIGHTY, P
    ELECTRONIC ENGINEERING, 1974, 46 (552): : 53 - &
  • [25] AUTOMATIC TEST EQUIPMENT
    VERNON, N
    ELECTRONICS AND POWER, 1977, 23 (01): : 44 - 48
  • [26] AUTOMATIC TEST EQUIPMENT
    WALKER, ME
    INSTRUMENT PRACTICE, 1968, 22 (12): : 1016 - &
  • [27] A General Automatic Test System for Instruments in IC Equipment
    Su, Xiaoshan
    Tian, Ling
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2012, 61 (09) : 2591 - 2599
  • [28] The development of synthetic automatic test system of armored equipment
    Zhang, CJ
    Zhang, FL
    Wang, T
    ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings, 2005, : 7400 - 7402
  • [29] General automatic test system for PCB of military equipment
    Sasa, M
    Zhao, SW
    Xiao, XF
    2004 8TH INTERNATIONAL CONFERENCE ON CONTROL, AUTOMATION, ROBOTICS AND VISION, VOLS 1-3, 2004, : 536 - 540
  • [30] Performance Evaluation of Non Volatile Memories with a Low Cost and Portable Automatic Test Equipment
    Alieri, Gineuve
    Giaconia, G. Costantino
    Mistretta, Leonardo
    La Rosa, Francesco
    Cimino, A. Angelo
    APPLICATIONS IN ELECTRONICS PERVADING INDUSTRY, ENVIRONMENT AND SOCIETY, APPLEPIES 2016, 2018, 429 : 147 - 152
12345