Study of Ag-alloy wire in thermosonic wire bonding

被引:0
|
作者
Wu, Jie [1 ]
Rockey, Tom
Yauw, Oranna [1 ]
Shen, Liming [1 ]
Chylak, Bob
机构
[1] Kulicke & Soffa Ltd Pte, Singapore 554910, Singapore
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Lower cost materials, such as copper (Cu) and palladium coated copper (PdCu) are the commonly chosen alternatives of gold (Au) wire in the package industry. However, the high hardness of Cu and PdCu wires brings concerns over the bonding quality and the long-term reliability of the packages. Silver (Ag) has drawn more attention in the package industry since it has similar properties like hardness, elongation and breaking load as Au, while having a comparable price to PdCu. Bondability of Ag-alloy wire, including performance of free air balls (FAB) and bonding capability on aluminum (Al) die pads, was first investigated. Inspection of intermetallic compound (IMC) and unmolded baking of the bonded packages with the Ag-alloy wire were also carried out for further understanding the reliability performance of the wire. Investigations of bonding capability comparison between pure Ag. Ag-alloy, and PdCu wires in processes with stand-off-stitch-bond (SSB) and peel sensitive dies were included in the study as well. Generally, Ag-alloy wire delivers good and stable bonding capability using N-2 as the cover gas. For applications with SSB and peel/lift sensitive bond pads which are normally difficult using PdCu wire, Ag-alloy wire also possesses good performance.
引用
收藏
页码:499 / 503
页数:5
相关论文
共 50 条
  • [41] STUDY OF TEMPERATURE PARAMETER ON THE THERMOSONIC GOLD WIRE BONDING OF HIGH-SPEED CMOS
    HU, SJ
    LIM, GE
    LIM, TL
    FOONG, KP
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1991, 14 (04): : 855 - 858
  • [42] TEM Interfacial Characteristics of Thermosonic Gold Wire Bonding on Aluminium Metallization
    Xu, H.
    Liu, C.
    Silberschmidt, V. V.
    Chen, Z.
    Sivakumar, M.
    2009 11TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC 2009), 2009, : 512 - +
  • [43] Evaluation of Ag Wire Reliability on Fine Pitch Wire Bonding
    Xi, Jiaqing
    Mendoza, Norbe
    Chen, Kevin
    Yang, Thomas
    Reyes, Edward
    Bezuk, Steve
    Lin, Juln
    Ke, Shenggin
    Chen, Eason
    2015 IEEE 65TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2015, : 1392 - 1395
  • [44] Study of wire bonding reliability of Ag-Pd-Au alloy wire with flash-gold after chlorination and sulfidation
    Wu, Yu-Hsien
    Hung, Fei-Yi
    Lui, Truan-Sheng
    Chen, Kuan-Jen
    MICROELECTRONICS RELIABILITY, 2019, 99 : 186 - 196
  • [45] Microstructure and bonding performance of an Au-coated Ag alloy wire
    Zhou, Wenyan
    Chen, Jialin
    Pei, Hongying
    Kang, Feifei
    Wu, Yongjin
    Kong, Jianwen
    Yang, Guoxiang
    Yi, Jianhong
    MICROELECTRONIC ENGINEERING, 2019, 217
  • [46] Ultrasonic power features of wire bonding and thermosonic flip chip bonding in microelectronics packaging
    Jun-hui Li
    Lei Han
    Jue Zhong
    Journal of Central South University of Technology, 2008, 15 : 684 - 688
  • [47] On the microcontact mechanism of thermosonic wire bonding in microelectronics: Saturation of interfacial phenomena
    Jeng, YR
    Chen, JY
    TRIBOLOGY TRANSACTIONS, 2005, 48 (01) : 127 - 132
  • [48] Bondability and Reliability of Ag Alloy Wire (92 and 95% Ag Alloy) on Thin Aluminum Bonding Pad
    Palagud, Jose, Jr.
    Wang, S. W.
    2016 IEEE 37TH INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY (IEMT) & 18TH ELECTRONICS MATERIALS AND PACKAGING (EMAP) CONFERENCE, 2016,
  • [49] An Influence Factor of High Reliable Thermosonic Au Wire-bonding
    Wang, Bin
    Mo, Xiu-ying
    Li, Hong-wei
    2012 IEEE 11TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT-2012), 2012, : 1085 - 1087
  • [50] Growth of Intermetallic Compounds in Thermosonic Copper Wire Bonding on Aluminum Metallization
    Xu, Hui
    Liu, Changqing
    Silberschmidt, Vadim V.
    Chen, Zhong
    JOURNAL OF ELECTRONIC MATERIALS, 2010, 39 (01) : 124 - 131