Measurement of the Common Source Inductance of Typical Switching Device Packages

被引:0
|
作者
Aikawa, Kyota [1 ]
Shiida, Tomohumi [1 ]
Matsumoto, Ryunosuke [1 ]
Umetani, Kazuhiro [1 ]
Hiraki, Eiji [1 ]
机构
[1] Okayama Univ, Grad Sch Nat Sci & Technol, Okayama, Japan
关键词
bonding wire; common source inductance; semiconductor package; stray inductance; PARASITIC INDUCTANCE; CONVERTERS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The common source inductance is one of the major causes of deterioration of the switching speed and susceptibility of the false triggering for semiconductor switching devices. Practical design of this inductance requires selection of an appropriate semiconductor package because this inductance is greatly dependent on the physical package structure. However, few studies have reported a list of the common source inductance of commercially available packages. In order to list and compare the common source inductance among typical semiconductor packages, this paper carried out measurement of this inductance of actual switching devices mounted on experimental PCBs. This paper employed a recently proposed straightforward measurement technique directly applicable to switching devices mounted on PCBs. As a result, a basic database of the common source inductance of typical packages was presented. The common source inductance was found to be determined mainly by the package type. However, in TO-247 and TO-220 packages, approximately one-third of the total common source inductance was found to possibly vary among the switching devices of the same package due to the dependence on the current rating. Investigation of the physical package structure implied that this dependence was caused by the stray inductance of the bonding wires connecting the semiconductor chip to the source terminal.
引用
收藏
页码:1172 / 1177
页数:6
相关论文
共 50 条
  • [41] The Trade-off of Switching Losses and EMI Generation for SiC MOSFET with Common Source and Kelvin Source Configurations
    Xue, Peng
    Davari, Pooya
    2023 25TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS, EPE'23 ECCE EUROPE, 2023,
  • [42] Measurement-device-independent quantum cryptographic conferencing with an untrusted source
    陈瑞柯
    鲍皖苏
    汪洋
    包海泽
    周淳
    江木生
    李宏伟
    Chinese Physics B, 2017, 26 (01) : 119 - 128
  • [43] Measurement-device-independent quantum cryptographic conferencing with an untrusted source
    Chen, Rui-Ke
    Bao, Wan-Su
    Wang, Yang
    Bao, Hai-Ze
    Zhou, Chun
    Jiang, Mu-Sheng
    Li, Hong-Wei
    CHINESE PHYSICS B, 2017, 26 (01)
  • [44] An ultrasonic device for source to skin surface distance measurement in patient setup
    Feng, YM
    Allison, R
    Hu, XH
    Mota, H
    Jenkins, T
    Wolfe, ML
    Sibata, C
    INTERNATIONAL JOURNAL OF RADIATION ONCOLOGY BIOLOGY PHYSICS, 2005, 61 (05): : 1587 - 1589
  • [45] Comparison of the Capacitances and Switching Losses of 1.2 kV Common-Source and Common-Drain Bidirectional Switch Topologies
    Kanale, Ajit
    Narasimhan, Sneha
    Cheng, Tzu-Hsuan
    Agarwal, Aditi
    Shah, Suyash Sushilkumar
    Baliga, B. Jayant
    Bhattacharya, Subhashish
    Hopkins, Douglas C.
    2021 IEEE 8TH WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS (WIPDA), 2021, : 112 - 117
  • [46] Modeling and Optimization Algorithm of Coupling Noise for SiC MOSFET Active Gate Driver Considering Common-Source Inductance
    Liu, Hengyang
    Kong, Wubin
    Long, Gen
    Lou, Hangchuan
    Wu, Xianglong
    Li, Dawei
    Liu, Zirui
    Dong, Minghai
    Zhao, Zian
    Wen, Yixue
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2024, 39 (11) : 14271 - 14283
  • [47] A Multilevel Self-Driving Gate Driver of SiC MOSFET for Crosstalk Suppression Considering Common-Source Inductance
    Hu, Kaiyuan
    Yang, Ming
    Zhang, Xinmei
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2025, 40 (01) : 906 - 919
  • [48] Modeling and Analysis of Bridge-Leg Crosstalk of GaN HEMT Considering Staged Effect of Common-Source Inductance
    Li, Xiao
    Liu, Xuyang
    Cao, Jianyu
    Liu, Yushan
    Yuan, Haiwen
    Xue, Yaosuo
    2022 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2022,
  • [49] Inverter nonlinearity compensation in the presence of current measurement errors and switching device parameter uncertainties
    Choi, Chan-Hee
    Cho, Kyung-Rae
    Seok, Jul-Ki
    2006 IEEE POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-7, 2006, : 826 - 832
  • [50] Inverter nonlinearity compensation in the presence of current measurement errors and switching device parameter uncertainties
    Choi, Chan-Hee
    Cho, Kyung-Rae
    Seok, Jul-Ki
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2007, 22 (02) : 576 - 583