High-resolution seismic reflection coefficient calculation using a Chirp Sub-bottom Profiler

被引：0
|
作者：
Sanhaji, Mohammed [1 ]
Porto, Sabrina [1 ]
Guarin, Humberto [2 ]
机构：
[1] EdgeTech, Boca Raton, FL 33487 USA
[2] Bert Instruments Inc, Miami, FL USA
来源：
2013 IEEE/OES ACOUSTICS IN UNDERWATER GEOSCIENCES SYMPOSIUM (RIO ACOUSTICS 2013) | 2013年
关键词：
EdgeTech; Bert Instruments Inc; Sub-bottom Profiler; high-resolution seismic reflection system; reflection coefficient;
D O I：
暂无
中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
High-resolution seismic data were collected by the Bert Instruments Inc. Company at the South-American Continental Shelf using EdgeTech SB-0512i sub-bottom profiler with frequency band from 500 Hz to 12 kHz. Core samples were taken along with 3 seismic sections in reason to allow detailed analysis of the layers which reflection coefficients were measured. The results were compared to Dr. Edwin L. Hamilton studies.
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页数：3
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