Structural and tribological properties of nitrogen doped amorphous carbon thin films synthesized by CFUBM sputtering method for protective coatings

被引:15
|
作者
Park, Yong Seob [1 ]
Hong, Byungyou [1 ,2 ]
机构
[1] Sungkyunkwan Univ, Sch Informat & Commun Engn, Suwon 440746, South Korea
[2] Sungkyunkwan Univ, CAPST, Suwon 440746, South Korea
关键词
a-C:N; CFUBM sputtering; Tribological properties; Friction coefficient; RAMAN-SPECTRA; CNX FILMS; DEPOSITION; DIAMOND; DENSITY; STRESS;
D O I
10.1016/j.apsusc.2008.07.190
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Nitrogen doped amorphous carbon (a-C:N) films are a material that may successfully compete with DLC coatings, which have high hardness, high wear resistance, and a low friction coefficient. The a-C: N films were prepared on silicon substrate by a closed-field unbalanced magnetron sputtering method with a graphite target and using the Ar/N-2 mixture gases. And, we investigated the effects of various DC bias voltages from 0 to - 300 V on the structural and tribological properties of the a-C: N films. This study was focused on improving physical properties of the a-C: N film by controlling process parameters like negative substrate DC bias voltage. The maximum hardness of the a-C: N film was 23 GPa, the friction coefficient was 0.08, and the critical load was 25 N on a Si wafer. Consequently, the structural and tribological properties of the a-C: N film showed a clear dependence on the energy of ions bombardment and the density of the sputtering and the reaction gases during film growth. (C) 2008 Elsevier B. V. All rights reserved.
引用
收藏
页码:3913 / 3917
页数:5
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