Multi-Lateral Shearing Interferometry: Principle and Application to X-Ray Phase Imaging

被引：3

作者：

Primot, Jerome ^{[1
]}

Rizzi, Julien ^{[1
]}

Mercere, Pascal ^{[2
]}

Idir, Mourad ^{[3
]}

Bon, Pierre ^{[4
]}

Wattellier, Benoit ^{[5
]}

Druart, Guillaume ^{[1
]}

Vincent, Gregory ^{[1
]}

Haidar, Riad ^{[1
]}

Weitkamp, Timm ^{[2
]}

Guerineau, Nicolas ^{[1
]}

Monneret, Serge ^{[4
]}

机构：

[1] Off Natl Etud & Rech Aerosp, Tre French Aerosp Lab, Chemin Huniere,BP 80100, F-91123 Palaiseau, France

[2] Synchrotron Soleil, F-91192 Gif Sur Yvette, France

[3] Brookhaven Natl Lab, NSLS 2, Upton, NY 11973 USA

[4] Aix Marseille Univ, Ecole Cent Marseille, CNRS, F-13013 Marseille, France

[5] Ecole Polytech, Xtec, Phas SA, F-91128 Palaiseau, France

来源：

INTERNATIONAL WORKSHOP ON X-RAY AND NEUTRON PHASE IMAGING WITH GRATINGS | 2012年 / 1466卷

关键词：

Multi Lateral Shearing Interferometry; grating interferometry; microscopy; X-ray; phase contrast imaging;

D O I：

10.1063/1.4742266

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Multi-lateral shearing interferometry [1] is an evolution of the classical lateral shearing interferometry: a grating based technique used for optical testing. Firstly developed for adaptive optics, for ultra-intense lasers characterization, or for lens testing, in visible or infrared, it has now been applied to visible quantitative phase microscopy of biological samples. The purpose of this paper is to present the transfer of this technique to the X-ray domain, stressing on the basic property of propagation invariance.

引用

页码：35 / 40

页数：6

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