Screening and conductance relaxations in insulating granular aluminium thin films

被引:1
|
作者
Delahaye, Julien [1 ]
Grenet, Thierry [1 ]
机构
[1] Univ Grenoble 1, Inst Neel, F-38042 Grenoble 9, France
关键词
ELECTRON GLASS; FIELD;
D O I
10.1088/1742-6596/376/1/012008
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have recently found in insulating granular Al thin film a new experimental feature [1], namely the existence of a conductance relaxation that is not sensitive to gate voltage changes. This conductance relaxation is related to the existence of a metallic-like screening in the film and can be used to estimate its characteristic length scale. In the present paper, we give some experimental details on how this feature was measured and present our first results on the screening length temperature dependence.
引用
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页数:6
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