Coexistence of Bipolar and Unipolar Switching of Cu and Oxygen Vacancy Nanofilaments in Cu/TaOx/Pt Resistive Devices

被引:36
|
作者
Liu, Tong [1 ]
Verma, Mohini [1 ]
Kang, Yuhong [1 ]
Orlowski, Marius K. [1 ]
机构
[1] Virginia Polytech Inst & State Univ, Blacksburg, VA 24061 USA
关键词
NONVOLATILE MEMORY; SOLID-ELECTROLYTE;
D O I
10.1149/2.012201ssl
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Switching of a resistive Cu/TaOx/Pt device can be based on the formation of two types of nanofilament in the same device: Cu and oxygen vacancy conductive filaments, depending on the polarity of switching voltage. Cu/TaOx/Pt device can be switched in bipolar and unipolar regimes. The two types of conduction can be distinguished by different values of the resistance temperature coefficient. Both positive and negative voltages can reset the device when sufficient Joule heating is produced. The negative set voltages for oxygen vacancy filaments show higher absolute values than those for the Cu filaments. The unique fourfold switching property of a Cu/TaOx/Pt device renders it flexible for a wide range of applications. (C) 2012 The Electrochemical Society. All rights reserved.
引用
收藏
页码:Q11 / Q13
页数:3
相关论文
共 50 条
  • [41] Multilevel resistance switching in Cu/TaOx/Pt structures induced by a coupled mechanism
    Yang, Y. C.
    Chen, C.
    Zeng, F.
    Pan, F.
    JOURNAL OF APPLIED PHYSICS, 2010, 107 (09)
  • [42] Duality characteristics of bipolar and unipolar resistive switching in a Pt/SrZrO3/TiOx/Pt stack
    Ju, Hyunsu
    Yang, Min Kyu
    AIP ADVANCES, 2020, 10 (06)
  • [43] Stabilized resistive switching behaviors of a Pt/TaOx/TiN RRAM under different oxygen contents
    Jeon, Heeyoung
    Park, Jingyu
    Jang, Woochool
    Kim, Hyunjung
    Kang, Chunho
    Song, Hyoseok
    Kim, Honggi
    Seo, Hyungtak
    Jeon, Hyeongtag
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2014, 211 (09): : 2189 - 2194
  • [44] Coexistence of unipolar and bipolar resistive switching behaviors in NiFe2O4 thin film devices by doping Ag nanoparticles
    He, Shuai (stsbdh@mail.sysu.edu.cn), 1600, American Institute of Physics Inc. (123):
  • [45] Realization of fast switching speed and electronic synapse in Ta/TaOx/AlN/Pt bipolar resistive memory
    Cao, Gang
    Yan, Xiaobing
    Wang, Jingjuan
    Zhou, Zhenyu
    Lou, Jianzhong
    Wang, Kaiyou
    AIP ADVANCES, 2020, 10 (05)
  • [46] Coexistence of unipolar and bipolar resistive switching behaviors in NiFe2O4 thin film devices by doping Ag nanoparticles
    Hao, Aize
    Ismail, Muhammad
    He, Shuai
    Huang, Wenhua
    Qin, Ni
    Bao, Dinghua
    JOURNAL OF APPLIED PHYSICS, 2018, 123 (08)
  • [47] Excellent resistive memory characteristics and switching mechanism using a Ti nanolayer at the Cu/TaOx interface
    Sheikh Ziaur Rahaman
    Siddheswar Maikap
    Ta-Chang Tien
    Heng-Yuan Lee
    Wei-Su Chen
    Frederick T Chen
    Ming-Jer Kao
    Ming-Jinn Tsai
    Nanoscale Research Letters, 7
  • [48] Matrices of on-chip Pt/TaOx/Ta resistive switching memory devices for future bioelectronic applications
    Zhuk, M.
    Negrov, D.
    Matveyev, Yu
    Zenkevich, A., V
    JOURNAL OF BIOENERGETICS AND BIOMEMBRANES, 2018, 50 (06) : 601 - 601
  • [50] An in-depth description of bipolar resistive switching in Cu/HfOx/Pt devices, a 3D kinetic Monte Carlo simulation approach
    Aldana, S.
    Roldan, J. B.
    Garcia-Fernandez, P.
    Sune, J.
    Romero-Zaliz, R.
    Jimenez-Molinos, F.
    Long, S.
    Gomez-Campos, F.
    Liu, M.
    JOURNAL OF APPLIED PHYSICS, 2018, 123 (15)