Carboxylic acids as oxygen sources for the atomic layer deposition of high-κ metal oxides

被引:24
|
作者
Rauwel, Erwan [1 ]
Willinger, Marc-Georg [1 ]
Ducroquet, Frederique [4 ]
Rauwel, Protima [2 ]
Matko, Igor [3 ]
Kiselev, Dmitry [2 ]
Pinna, Nicola [1 ]
机构
[1] Univ Aveiro, Dept Chem, CICECO, P-3810193 Aveiro, Portugal
[2] Univ Aveiro, Dept Ceram, CICEO, P-3810193 Aveiro, Portugal
[3] INPG Minatec, CNRS, UMR 5628, LMGP, F-38016 Grenoble 1, France
[4] INPG Minatec, CNRS, UMR 5130, IMEP, F-38016 Grenoble 1, France
来源
JOURNAL OF PHYSICAL CHEMISTRY C | 2008年 / 112卷 / 33期
关键词
D O I
10.1021/jp8037363
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A nonaqueous approach inspired from sol-gel chemistry and adapted to the deposition of metal oxide thin films by atomic layer deposition (ALD) is presented. The process is based on the reaction of a carboxylic acid with a metal alkoxide. Contrary to classical approaches, no oxygen source that could lead to the oxidation of the silicon substrate is required. Instead, a surface esterification reaction is responsible for the film formation. The growth of metal oxides is achieved at temperatures as low as 50 degrees C on various supports including carbon nanotubes, organic fibers, and silicon wafers. The as-grown films show an excellent conformality and possess good dielectric properties due to their high purity. Inherent to the chemical approach is the possibility to grow oxides on silicon while minimizing the formation of a low-kappa interfacial layer.
引用
收藏
页码:12754 / 12759
页数:6
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