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Surface morphology study of basic ammonothermal GaN grown on non-polar GaN seed crystals of varying surface orientations from m-plane to a-plane
被引:23
|作者:
Pimputkar, S.
[1
]
Kawabata, S.
[2
]
Speck, J. S.
[1
]
Nakamura, S.
[1
]
机构:
[1] Univ Calif Santa Barbara, Dept Mat, Solid State Lighting & Energy Ctr, Santa Barbara, CA 93106 USA
[2] Mitsubishi Chem Corp, Optoelect Lab, Ushiku, Ibaraki 3001295, Japan
基金:
美国国家科学基金会;
关键词:
Growth rate;
Surface morphology;
Ammonothermal crystal growth;
Single crystal growth;
Bulk GaN;
Nitrides;
D O I:
10.1016/j.jcrysgro.2013.01.022
中图分类号:
O7 [晶体学];
学科分类号:
0702 ;
070205 ;
0703 ;
080501 ;
摘要:
GaN crystals were grown on hydride vapor phase epitaxy (HVPE) GaN seed crystals with non-polar surface orientations varying between on-axis m-plane and a-plane using the basic ammonothermal method. Three different surface morphology regimes were observed with the surface features including mounds, slate-like morphologies, and pyramidal 'spikes' composed of (0001) and non-polar microfacets. A macroscopic off-orientation of the non-steady-state surface and newly appearing steady-state growth surfaces towards [0001] by approximately 1 degrees was observed with geometric constraints suggesting an off-orientation of the observed {10-10} microfacets towards [000 (1) over bar] by approximately 1 or greater. (C) 2013 Elsevier B.V. All rights reserved.
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页码:67 / 71
页数:5
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