共 50 条
- [31] The Effect of Interface Thickness of High-k/Metal Gate Stacks on NFET Dielectric Reliability 2009 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, VOLS 1 AND 2, 2009, : 510 - +
- [36] Metal/High-k/Metal Nanocrystal/SiO2 Gate Stacks for NAND Flash Applications PHYSICS AND TECHNOLOGY OF HIGH-K GATE DIELECTRICS 7, 2009, 25 (06): : 481 - 490
- [39] Different noise mechanisms in high-k dielectric gate stacks NOISE IN DEVICES AND CIRCUITS III, 2005, 5844 : 177 - 184