Parallel C4 Packaging of MEMS Using Self-Alignment: Simulation and Experiments

被引:4
|
作者
Taprogge, Jens L. M. [1 ]
Beyeler, Felix [2 ]
Steinecker, Alexander [1 ]
Nelson, Bradley J. [3 ]
机构
[1] Ctr Suisse Elect & Microtech, CH-6055 Alpnach Dorf, Switzerland
[2] FemtoTools GmbH, CH-8107 Buchs, Switzerland
[3] ETH, Inst Robot & Intelligent Syst, CH-8092 Zurich, Switzerland
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 2013年 / 3卷 / 08期
关键词
Alignment; bismuth; chip-scale packaging (CSP); controlled collapse chip connection (C4); deep reactive ion etching (DRIE); direct chip attach (DCA); dynamics; FemtoTools; flip chip; flux; force sensor; microelectromechanical systems (MEMS); microoptoelectromechanical systems (MOEMS); motion; silicon-on-insulator (SOI); self-alignment; simulation; solder paste; wafer-level packaging (WLP); wetting; FLIP-CHIP; SURFACE-TENSION; SOLDER; ALLOYS; BI; FLUXES; JOINTS;
D O I
10.1109/TCPMT.2013.2254489
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Packaging is one of the major cost drivers for microelectromechanical systems (MEMS). Currently wire bonding is the dominant method for electrically connecting MEMS chips to the substrate. Using self-alignment, a method for packaging multiple MEMS at the same time has been developed. The presented process achieves high throughput and precise alignment at low cost. The controlled collapse chip connection (C4) process has been adapted to the specific requirements of MEMS. The combination of coarse robotics and liquid solder self-alignment guarantees precise positioning and alignment of the individual MEMS chips to the respective substrates. The new method has been implemented in a case study. In the study, force sensors were packaged. Precise angular alignment of the sensors is critical for making accurate measurements. Results of the case study are presented. The alignment motion is analyzed, compared with results in the literature, and simulated. These simulations, in combination with our experiments, indicate that the motion is dominated by solder-specific effects such as oxide removal, wetting, and flux solvent evaporation.
引用
收藏
页码:1420 / 1429
页数:10
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