Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method

被引:0
|
作者
Kobayashi, Y [1 ]
Shimizu, T [1 ]
机构
[1] Saitama Univ, Dept Elect & Elect Syst, Urawa, Saitama 3388570, Japan
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel circular cavity resonance method based on a rigorous analysis by the mode matching technique is proposed to measure the temperature dependences of complex permittivity of low loss dielectric plates accurately in the millimeter wave range 30-100 GHz. The measured results for GaAs substrates verify the usefulness.
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页码:1885 / 1888
页数:4
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