Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by a cavity resonance method

被引：0
|
作者：
Kobayashi, Y [1 ]
Shimizu, T [1 ]
机构：
[1] Saitama Univ, Dept Elect & Elect Syst, Urawa, Saitama 3388570, Japan
来源：
1999 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-4 | 1999年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A novel circular cavity resonance method based on a rigorous analysis by the mode matching technique is proposed to measure the temperature dependences of complex permittivity of low loss dielectric plates accurately in the millimeter wave range 30-100 GHz. The measured results for GaAs substrates verify the usefulness.
引用
收藏
页码：1885 / 1888
页数：4
相关论文
共 50 条
  • [1] Millimeter wave measurements of temperature dependence of complex permittivity of dielectric plates by the cavity resonance method
    Zhang, G
    Nakaoka, S
    Kobayashi, Y
    1997 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS, VOLS I-III, 1997, : 913 - 916
  • [2] Millimeter wave measurements of temperature dependence of complex permittivity of GaAs plates by a circular waveguide method
    Shimizu, T
    Kobayashi, Y
    2001 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2001, : 2195 - 2198
  • [3] Measurements of complex permittivity for dielectric film at millimeter wave frequencies by a cavity resonator
    Hiromichi Y.
    Akira N.
    IEEJ Transactions on Electronics, Information and Systems, 2011, 131 (07) : 1287 - 1292
  • [4] Complex permittivity measurement of unknown dielectric plates by the cavity resonance method
    Zhang, G
    Kobayashi, Y
    ICEMI '97 - CONFERENCE PROCEEDINGS: THIRD INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, 1997, : 470 - 473
  • [5] Millimeter-Wave Resonant Cavity for Complex Permittivity Measurements of Materials
    Karns, Duane C.
    Weatherall, James C.
    Greca, Joseph
    Smith, Peter R.
    Yam, Kevin
    Barber, Jeffrey
    Smith, Barry T.
    2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS, 2018, : 1006 - 1009
  • [6] Millimeter Wave Complex Permittivity Measurements of High Dielectric Strength Thermoplastics
    Rahman, Nahid
    Chen, Shu
    Korolev, Konstantin A.
    Afsar, Mohammed N.
    Cheung, Rudy
    Aghion, Maurice
    2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5, 2008, : 2146 - +
  • [7] Round robin test on a cavity resonance method to measure complex permittivity of dielectric plates at microwave frequency
    Kobayashi, Yoshio
    Nakayama, Akira
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2006, 13 (04) : 751 - 759
  • [8] Complex permittivity measurements of dielectric plates using a dielectric loaded cavity resonator in UHF band
    Saitama Univ, Urawa, Japan
    Electron Commun Jpn Part II Electron, 7 (20-30):
  • [9] Millimeter wave dielectric permittivity measurements of common materials
    Nguyen, K. N.
    Chen, S.
    Afsar, M. N.
    Korolev, K. A.
    CONFERENCE DIGEST OF THE 2006 JOINT 31ST INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 14TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS, 2006, : 483 - 483
  • [10] Complex dielectric permittivity measurements of materials in millimeter waves
    Korolev, KA
    Afsar, MN
    IRMMW-THz2005: The Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, Vols 1 and 2, 2005, : 594 - 595
12345