Analytic Model of Specific ON-State Resistance for Superjunction MOSFETs With an Oxide Pillar

被引:10
|
作者
Kang, H. [1 ]
Udrea, F. [1 ]
机构
[1] Univ Cambridge, Elect Engn Dept, Cambridge CB30FA, England
关键词
Superjunction; JFET; oxide; MATERIAL LIMIT;
D O I
10.1109/LED.2019.2906559
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An analytical model for superjunction (SJ) MOSFETs having an oxide pillar between the n-pillar and the p-pillar is developed. Owing to the low permittivity of the oxide, a high electric field is sustained across the oxide. This reduces the parasitic depletion widthwithin the n-pillar, thus improving the current conducting path. The advantage of this structure is particularly visible as the cell pitch is scaled down and the pillows become narrower. The use of an oxide pillar leads to 30% reduction in the specific ON-state resistance when compared to a conventional SJ for a 2-mu m cell pitch. The analytical model shows a good agreement with the simulation results.
引用
收藏
页码:761 / 764
页数:4
相关论文
共 30 条
  • [21] Analytic Model for Undoped Symmetric Double-Gate MOSFETs With Small Gate-Oxide-Thickness Asymmetry
    Chang, Sheng
    Wang, Gaofeng
    Huang, Qijun
    Wang, Hao
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2009, 56 (10) : 2297 - 2301
  • [22] SPECIFIC ELECTRIC-RESISTANCE OF BERYLLIUM-OXIDE IN THE MOLTEN STATE
    SHPILRAIN, EE
    KAGAN, DN
    BARKHATOV, LS
    ZHMAKIN, LI
    HIGH TEMPERATURE, 1978, 16 (03) : 451 - 453
  • [23] Analytic gradients for the state-specific multireference coupled cluster singles and doubles model
    Prochnow, Eric
    Evangelista, Francesco A.
    Schaefer, Henry F., III
    Allen, Wesley D.
    Gauss, Juergen
    JOURNAL OF CHEMICAL PHYSICS, 2009, 131 (06):
  • [24] A new on-state drain-bias TDDB lifetime model and HCI effect on drain-bias TDDB of ultra thin oxide
    Liao, P. J.
    Chen, Chia Lin
    Young, J. W.
    Tsai, Y. S.
    Wang, C. J.
    Wu, Kenneth
    2008 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 46TH ANNUAL, 2008, : 210 - +
  • [25] On the Frequency Dependence of Oxide Trap Coupling in Nanoscale MOSFETs: Understanding based on Complete 4-State Trap Model
    Hao, Peng
    Mao, Dongyuan
    Wang, Runsheng
    Guo, Shaofeng
    Ren, Pengpeng
    Huang, Ru
    2016 13TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2016, : 981 - 983
  • [26] Modeling of a triple reduced surface field silicon-on-insulator lateral double-diffused metal–oxide–semiconductor field-effect transistor with low on-state resistance
    王裕如
    刘祎鹤
    林兆江
    方冬
    李成州
    乔明
    张波
    Chinese Physics B, 2016, 25 (02) : 434 - 439
  • [27] Modeling of a triple reduced surface field silicon-on-insulator lateral double-diffused metal-oxide-semiconductor field-effect transistor with low on-state resistance
    Wang, Yu-Ru
    Liu, Yi-He
    Lin, Zhao-Jiang
    Fang, Dong
    Li, Cheng-Zhou
    Qiao, Ming
    Zhang, Bo
    CHINESE PHYSICS B, 2016, 25 (02)
  • [28] AlGaN/GaN-on-Silicon Metal-Oxide-Semiconductor High-Electron-Mobility Transistor with Breakdown Voltage of 800V and On-State Resistance of 3 mΩ.cm2 Using a Complementary Metal-Oxide-Semiconductor Compatible Gold-Free Process
    Liu, Xinke
    Zhan, Chunlei
    Chan, Kwok Wai
    Liu, Wei
    Tan, Leng Seow
    Chen, Kevin Jing
    Yeo, Yee-Chia
    APPLIED PHYSICS EXPRESS, 2012, 5 (06)
  • [29] Closed-form breakdown voltage/specific on-resistance model using charge superposition technique for vertical power double-diffused metal–oxide–semiconductor device with high-κ insulator
    陈雪
    汪志刚
    王喜
    James B Kuo
    Chinese Physics B, 2018, (04) : 533 - 539
  • [30] Closed-form breakdown voltage/specific on-resistance model using charge superposition technique for vertical power double-diffused metal-oxide-semiconductor device with high-k insulator
    Chen, Xue
    Wang, Zhi-Gang
    Wang, Xi
    Kuo, James B.
    CHINESE PHYSICS B, 2018, 27 (04)