electrical properties;
carbon nanotubes;
thick films;
field emission;
D O I:
10.1016/j.matlet.2008.01.047
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Pastes for field emission test were prepared by 3-roll milling of multi-walled carbon nanotubes (MWNTs) and UV-sensitive binder solution. The effects of four filler additives, namely two types of indium tin oxide (ITO) powder, glass frit and Ag on the field emission properties of the screen-printed paste were investigated and compared to those without filler using a diode-type configuration. The paste formulation was shown to be adequate for fine patterning using a UV-lithography technique. MWNT pastes containing any type of filler showed better emission properties than the paste without filler, thereby confirming the importance of the filler. The MWNT paste with 1 wt.% glass frit showed the best results with the lowest turn-on field of 1.75 V/mu m at 1 mu A/cm(2), highest emission current density of 78 mu A/cm(2) at 5 V/mu m, and beta-factor of 17,000 approximately, which are satisfactory for practical application. (C) 2008 Elsevier B.V. All rights reserved.
机构:
N China Elect Power Univ, Sch Elect & Elect Engn, Inst Modern Elect Technol, Beijing 102206, Peoples R ChinaN China Elect Power Univ, Sch Elect & Elect Engn, Inst Modern Elect Technol, Beijing 102206, Peoples R China
Sun, Jianping
AD'07: Proceedings of Asia Display 2007, Vols 1 and 2,
2007,
: 382
-
385
机构:
Tsing Hua Univ, Sch Mat Sci & Engn, Electron Microscopy Lab, Beijing 100084, Peoples R ChinaTsing Hua Univ, Sch Mat Sci & Engn, Electron Microscopy Lab, Beijing 100084, Peoples R China
Sun, WX
Huang, ZP
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Tsing Hua Univ, Sch Mat Sci & Engn, Electron Microscopy Lab, Beijing 100084, Peoples R ChinaTsing Hua Univ, Sch Mat Sci & Engn, Electron Microscopy Lab, Beijing 100084, Peoples R China
Huang, ZP
Zhang, L
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机构:
Tsing Hua Univ, Sch Mat Sci & Engn, Electron Microscopy Lab, Beijing 100084, Peoples R ChinaTsing Hua Univ, Sch Mat Sci & Engn, Electron Microscopy Lab, Beijing 100084, Peoples R China
Zhang, L
Zhu, J
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机构:
Tsing Hua Univ, Sch Mat Sci & Engn, Electron Microscopy Lab, Beijing 100084, Peoples R ChinaTsing Hua Univ, Sch Mat Sci & Engn, Electron Microscopy Lab, Beijing 100084, Peoples R China
机构:
Sungkyunkwan Univ, Dept Chem Engn, Seoul, South KoreaSungkyunkwan Univ, Dept Chem Engn, Seoul, South Korea
Son, Seung-Yong
Lee, Yoong
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Sungkyunkwan Univ, Dept Chem Engn, Seoul, South KoreaSungkyunkwan Univ, Dept Chem Engn, Seoul, South Korea
Lee, Yoong
Lee, Dong Hyun
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Sungkyunkwan Univ, Dept Chem Engn, Seoul, South KoreaSungkyunkwan Univ, Dept Chem Engn, Seoul, South Korea
Lee, Dong Hyun
Kim, Sang Done
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机构:
Korea Adv Inst Sci & Technol, Dept Chem & Biomol Engn, Seoul, South Korea
Korea Adv Inst Sci & Technol, Energy & Environm Res Ctr, Seoul, South KoreaSungkyunkwan Univ, Dept Chem Engn, Seoul, South Korea
Kim, Sang Done
Sung, Su-Hwan
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机构:
Kyungpook Natl Univ, Dept Chem Engn, Taegu, South KoreaSungkyunkwan Univ, Dept Chem Engn, Seoul, South Korea
Sung, Su-Hwan
Hong, Sang-Young
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机构:Sungkyunkwan Univ, Dept Chem Engn, Seoul, South Korea
Hong, Sang-Young
Cho, Shin-Je
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机构:Sungkyunkwan Univ, Dept Chem Engn, Seoul, South Korea