Analysis and modeling of resistive switching mechanisms oriented to resistive random-access memory

被引:6
|
作者
Huang Da [1 ,2 ]
Wu Jun-Jie [2 ]
Tang Yu-Hua [2 ]
机构
[1] Natl Univ Def Technol, State Key Lab High Performance Comp, Changsha 410073, Hunan, Peoples R China
[2] Natl Univ Def Technol, Sch Comp, Changsha 410073, Hunan, Peoples R China
基金
中国国家自然科学基金;
关键词
resistive random-access memory; resistive switching mechanism; circuit model; BIPOLAR;
D O I
10.1088/1674-1056/22/3/038401
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
With the progress of the semiconductor industry, the resistive random-access memory (RAM) has drawn increasing attention. The discovery of the memristor has brought much attention to this study. Research has focused on the resistive switching characteristics of different materials and the analysis of resistive switching mechanisms. We discuss the resistive switching mechanisms of different materials in this paper and analyze the differences of those mechanisms from the view point of circuitry to establish their respective circuit models. Finally, simulations are presented. We give the prospect of using different materials in resistive RAM on account of their resistive switching mechanisms, which are applied to explain their resistive switchings.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] Utilizing compliance current level for controllability of resistive switching in nickel oxide thin films for resistive random-access memory
    Tsai, Tsung-Ming
    Lin, Chun-Chu
    Chen, Wen-Chung
    Wu, Cheng-Hsien
    Yang, Chih-Cheng
    Tan, Yung-Fang
    Wu, Pei-Yu
    Huang, Hui-Chun
    Zhang, Yong-Ci
    Sun, Li-Chuan
    Chou, Sheng-Yao
    JOURNAL OF ALLOYS AND COMPOUNDS, 2020, 826
  • [22] Effects of conducting defects on resistive switching characteristics of SiNx-based resistive random-access memory with MIS structure
    Kim, Sungjun
    Cho, Seongjae
    Ryoo, Kyung-Chang
    Park, Byung-Gook
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2015, 33 (06):
  • [23] In Situ Demonstration of the Link Between Mechanical Strength and Resistive Switching in Resistive Random-Access Memories
    Shi, Yuanyuan
    Ji, Yanfeng
    Hui, Fei
    Nafria, Montserrat
    Porti, Marc
    Bersuker, Gennadi
    Lanza, Mario
    ADVANCED ELECTRONIC MATERIALS, 2015, 1 (04):
  • [24] A compute-in-memory chip based on resistive random-access memory
    Weier Wan
    Rajkumar Kubendran
    Clemens Schaefer
    Sukru Burc Eryilmaz
    Wenqiang Zhang
    Dabin Wu
    Stephen Deiss
    Priyanka Raina
    He Qian
    Bin Gao
    Siddharth Joshi
    Huaqiang Wu
    H.-S. Philip Wong
    Gert Cauwenberghs
    Nature, 2022, 608 : 504 - 512
  • [25] A compute-in-memory chip based on resistive random-access memory
    Wan, Weier
    Kubendran, Rajkumar
    Schaefer, Clemens
    Eryilmaz, Sukru Burc
    Zhang, Wenqiang
    Wu, Dabin
    Deiss, Stephen
    Raina, Priyanka
    Qian, He
    Gao, Bin
    Joshi, Siddharth
    Wu, Huaqiang
    Wong, H-S Philip
    Cauwenberghs, Gert
    NATURE, 2022, 608 (7923) : 504 - +
  • [26] Analysis of the Bipolar Resistive Switching Behavior of a Biocompatible Glucose Film for Resistive Random Access Memory
    Park, Sung Pyo
    Tak, Young Jun
    Kim, Hee Jun
    Lee, Jin Hyeok
    Yoo, Hyukjoon
    Kim, Hyun Jae
    ADVANCED MATERIALS, 2018, 30 (26)
  • [27] Cobalt ferrite as an active material for resistive random-access memory
    Ketankumar Gayakvad
    K K Patankar
    Pramana, 2021, 95
  • [28] A versatile compact model of resistive random-access memory (RRAM)
    Tung, Chien-Ting
    Dabhi, Chetan Kumar
    Salahuddin, Sayeef
    Hu, Chenming
    SOLID-STATE ELECTRONICS, 2024, 220
  • [29] Graphene band engineering for resistive random-access memory application
    Koohzadi, Pooria
    Ahmadi, Mohammad Taghi
    Karamdel, Javad
    Truong Khang Nguyen
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2020, 34 (18):
  • [30] Aliens: A Novel Hybrid Architecture for Resistive Random-Access Memory
    Wu, Bing
    Feng, Dan
    Tong, Wei
    Liu, Jingning
    Li, Shuai
    Yang, Mingshun
    Wang, Chengning
    Zhang, Yang
    2018 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD) DIGEST OF TECHNICAL PAPERS, 2018,