Improving the energy resolution of X-ray and electron energy-loss spectra

被引:14
|
作者
Egerton, R. F. [1 ]
Qian, H.
Malac, M.
机构
[1] Univ Alberta, Phys Dept, Edmonton, AB T6G 2J1, Canada
[2] Natl Inst Nanotechnol, Edmonton, AB, Canada
关键词
EELS; energy resolution; maximum entropy; maximum likelihood; monochromator;
D O I
10.1016/j.micron.2005.11.005
中图分类号
TH742 [显微镜];
学科分类号
摘要
We discuss some practical, problems of improving the resolution of X-ray and electron spectra. Iterative Bayesian methods promise greater resolution enhancement than Fourier techniques but they also give rise to spectral artifacts. Satellite peaks are generated adjacent to strong peaks in the original spectrum and oscillatory artifacts become prominent after a large number of iterations, particularly when the original data contain high noise content. In the case of valence-electron energy-loss spectra, satellite peaks are reduced by removing the zero-loss peak prior to spectral sharpening. Even so, care should be exercised in interpreting low intensity at low energy loss (after sharpening) as evidence for a bandgap in the electronic density of states. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:310 / 315
页数:6
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