Imaging of Graphene with Confocal Raman and Atomic Force Microscopy

被引：0
|
作者：
机构：
[1] WITec GmbH, D-89081 Ulm, Germany
来源：
SPECTROSCOPY | 2013年
关键词：
D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The characterization of graphene with combined Raman-AFM imaging provides a nondestructive method to extensively investigate its properties.
引用
收藏
页码：25 / 25
页数：1
相关论文
共 50 条
  • [31] Imaging and force probing RNA by atomic force microscopy
    Schon, Peter
    METHODS, 2016, 103 : 25 - 33
  • [32] Characterization of polyelectrolyte microcapsules by confocal laser scanning microscopy and atomic force microscopy
    Podskocová, J
    Chorvat, D
    Kolláriková, G
    Lacík, I
    LASER PHYSICS, 2005, 15 (04) : 545 - 551
  • [33] Statistical analysis of atomic force microscopy and Raman spectroscopy data for estimation of graphene layer numbers
    Obraztsova, Ekaterina A.
    Osadchy, Alexander V.
    Obraztsova, Elena D.
    Lefrant, Serge
    Yaminsky, Igor V.
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2008, 245 (10): : 2055 - 2059
  • [34] COLL 42-Combining confocal Raman spectroscopy and atomic force microscopy for characterization of pulp fiber surfaces
    Osterberg, Monika
    Jaaskelainen, Anna-Stiina
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2006, 232
  • [35] Effect of alkaline treatment on cellulose supramolecular structure studied with combined confocal Raman spectroscopy and atomic force microscopy
    Eronen, Paula
    Osterberg, Monika
    Jaaskelainen, Anna-Stiina
    CELLULOSE, 2009, 16 (02) : 167 - 178
  • [36] Effect of alkaline treatment on cellulose supramolecular structure studied with combined confocal Raman spectroscopy and atomic force microscopy
    Paula Eronen
    Monika Österberg
    Anna-Stiina Jääskeläinen
    Cellulose, 2009, 16
  • [37] Imaging and force transduction in correlative scanning force and confocal fluorescence microscopy
    Basche, Thomas
    XIII INTERNATIONAL CONFERENCE ON HOLE BURNING, SINGLE MOLECULE, AND RELATED SPECTROSCOPIES: SCIENCE AND APPLICATIONS (HBSM-2018), 2018, 190
  • [38] Imaging and Nanoprobing of Graphene Layers on Ni Damascene Interconnects by Conductive Atomic Force Microscopy
    Zhang, Li
    Ishikura, Taishi
    Wada, Makoto
    Katagiri, Masayuki
    Nishide, Daisuke
    Matsumoto, Takashi
    Sakuma, Naoshi
    Kajita, Akihiro
    Sakai, Tadashi
    2014 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2014,
  • [39] Medical Applications of Atomic Force Microscopy and Raman Spectroscopy
    Choi, Samjin
    Jung, Gyeong Bok
    Kim, Kyung Sook
    Lee, Gi-Ja
    Park, Hun-Kuk
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2014, 14 (01) : 71 - 97
  • [40] Comparison study of live cells by atomic force microscopy, confocal microscopy, and scanning electrochemical microscopy
    Zhao, Xiaocui
    Petersen, Nils O.
    Ding, Zhifeng
    CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 2007, 85 (03): : 175 - 183
12345