Electron diffraction studies of epitaxial C-60 thin films on mica(001)

被引：3
|
作者：
Lindner, JKN
Henke, S
Rauschenbach, B
Stritzker, B
机构：
[1] Universität Augsburg, Institut für Physik
来源：
THIN SOLID FILMS | 1996年 / 279卷 / 1-2期
关键词：
C-60; electron diffraction; mica;
D O I：
10.1016/0040-6090(95)08160-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
C-60 thin films were thermally evaporated onto mica(001) substrates at a temperature of 200 degrees C and a deposition rate of 0.5 Angstrom s(-1). The 2500 Angstrom thick films were studied using high-voltage transmission electron microscopy (HVTEM) and electron diffraction. Oriented growth of C-60 on mica with C-60(111)parallel to mica(001) was observed as well as twin formation about the three <[11(1)over bar ]> axes. The observed orientation relationships are discussed on the basis of structural considerations.
引用
收藏
页码：106 / 109
页数：4
相关论文
共 50 条
  • [41] Thickness correlated effects of the crystal and surface structure of C-60 thin films grown on mica by hot wall epitaxy
    Stifter, D
    Sitter, H
    THIN SOLID FILMS, 1996, 280 (1-2) : 83 - 85
  • [42] Persistent photoelectric phenomena in oxygenated C-60 thin films
    Katz, EA
    Lyubin, V
    Faiman, D
    Shtutina, S
    Shames, A
    Goren, S
    SOLID STATE COMMUNICATIONS, 1996, 100 (11) : 781 - 784
  • [43] INTERFACIAL AND VIBRATIONAL PROPERTIES OF THIN-FILMS OF C-60
    BROUSSEAU, JL
    TIAN, K
    GAUVIN, S
    LEBLANC, RM
    DELHAES, P
    CHEMICAL PHYSICS LETTERS, 1993, 202 (06) : 521 - 527
  • [44] ELECTRICAL PHENOMENA OF C-60 TETRACYANOQUINODIMETHANE THIN-FILMS
    GAO, HJ
    XUE, ZQ
    WU, QD
    CHINESE PHYSICS LETTERS, 1994, 11 (12): : 766 - 769
  • [45] EFFECTS OF ANNEALING ON THE CONDUCTIVITY OF C-60 THIN-FILMS
    BELUMARIAN, A
    MANAILA, R
    STOICA, T
    DRAGOMIR, A
    MANCIU, M
    DEVENYI, A
    BRAUN, T
    FULLERENE SCIENCE AND TECHNOLOGY, 1995, 3 (05): : 495 - 509
  • [46] PROTON IRRADIATION OF THIN-FILMS OF C-60 MOLECULES
    MUSKET, RG
    HAWLEYFEDDER, RA
    BELL, WL
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1991, 118 (03): : 225 - 235
  • [47] Electrical properties of C-60 thin films: Preliminary results
    Augelli, V
    Casamassima, G
    Ligonzo, T
    Loiacono, D
    Schiavulli, L
    Valentini, A
    ADVANCES IN CRYSTAL GROWTH, 1996, 203 : 303 - 307
  • [48] Hydrogen and humidity sensing properties of C-60 thin films
    Sberveglieri, G
    Faglia, G
    Perego, C
    Nelli, P
    Marks, RN
    Virgilli, T
    Taliani, C
    Zambonin, R
    SYNTHETIC METALS, 1996, 77 (1-3) : 273 - 275
  • [49] Transport studies in C-60 and C-60/C-70 thin films using metal-insulator-semiconductor field-effect transistors
    Jarrett, CP
    Pichler, K
    Newbould, R
    Friend, RH
    SYNTHETIC METALS, 1996, 77 (1-3) : 35 - 38
  • [50] LARGE NONLINEAR ABSORPTION IN C-60 THIN-FILMS
    GU, G
    ZHANG, WC
    ZEN, H
    DU, YW
    HAN, YN
    ZHANG, WJ
    DONG, FZ
    XIA, YX
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1993, 26 (15) : L451 - L455
12345