Atomic-scale imaging of catalysts in their functional state by aberration-corrected environmental transmission electron microscopy (ETEM)

被引:0
|
作者
Jinschek, Joerg R. [1 ]
机构
[1] FEI Co, Mat Sci BU, Eindhoven, Netherlands
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
383-ENFL
引用
收藏
页数:1
相关论文
共 50 条
  • [11] Atomic-Scale Insights into the 2D Materials from Aberration-Corrected Scanning Transmission Electron Microscopy: Progress and Future
    Sohn, Woonbae
    Kim, Miyoung
    Jang, Ho Won
    SMALL SCIENCE, 2024, 4 (02):
  • [12] Aberration-corrected scanning transmission electron microscopy for atomic-resolution studies of functional oxides
    MacLaren, Ian
    Ramasse, Quentin M.
    INTERNATIONAL MATERIALS REVIEWS, 2014, 59 (03) : 115 - 131
  • [13] Tomographic imaging of nanocrystals by aberration-corrected scanning transmission electron microscopy
    van Benthem, K
    Peng, YP
    Pennycook, SJ
    Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure, 2005, 839 : 3 - 7
  • [14] Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems
    Pennycook, S. J.
    Chisholm, M. F.
    Lupini, A. R.
    Varela, M.
    Borisevich, A. Y.
    Oxley, M. P.
    Luo, W. D.
    van Benthem, K.
    Oh, S. -H.
    Sales, D. L.
    Molina, S. I.
    Garcia-Barriocanal, J.
    Leon, C.
    Santamaria, J.
    Rashkeev, S. N.
    Pantelides, S. T.
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2009, 367 (1903): : 3709 - 3733
  • [15] Spherical Aberration-Corrected Transmission Electron Microscopy for Nanomaterials
    Tanaka, Nobuo
    ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 153, 2008, 153 : 385 - +
  • [16] Progress in aberration-corrected scanning transmission electron microscopy
    Dellby, N
    Krivanek, OL
    Nellist, PD
    Batson, PE
    Lupini, AR
    JOURNAL OF ELECTRON MICROSCOPY, 2001, 50 (03): : 177 - 185
  • [17] Aberration-corrected scanning transmission electron microscopy of semiconductors
    Krivanek, O. L.
    Dellby, N.
    Murfitt, M. F.
    17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, 2011, 326
  • [18] Direct Atomic-Scale Imaging of Hydrogen and Oxygen Interstitials in Pure Niobium Using Atom-Probe Tomography and Aberration-Corrected Scanning Transmission Electron Microscopy
    Kim, Yoon-Jun
    Tao, Runzhe
    Klie, Robert F.
    Seidman, David N.
    ACS NANO, 2013, 7 (01) : 732 - 739
  • [19] Direct Imaging of Light Elements in Aberration-Corrected Scanning Transmission Electron Microscopy
    Idrobo, J. C.
    Oxley, M. P.
    Walkosz, W.
    Klie, R. F.
    Oeguet, S.
    Mikijelj, B.
    Pennycook, S. J.
    Pantelides, S. T.
    MICROSCOPY AND MICROANALYSIS, 2009, 15 : 1480 - 1481
  • [20] Phase-contrast imaging in aberration-corrected scanning transmission electron microscopy
    Krumeich, F.
    Mueller, E.
    Wepf, R. A.
    MICRON, 2013, 49 : 1 - 14