A new technique for on-chip error estimation and reconfiguration of current-steering digital-to-analog converters

被引:10
|
作者
Rafeeque, KPS [1 ]
Vasudevan, V
机构
[1] Texas Instruments Inc, Bangalore 560093, Karnataka, India
[2] Indian Inst Technol, Dept Elect Engn, Madras 600036, Tamil Nadu, India
关键词
built-in self-test; digital-to-analog converters (DACs); reconfiguration;
D O I
10.1109/TCSI.2005.853587
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we propose a reconfigurable current-steering digital-to-analog converter (DAC). The differential nonlinearity error (DNL) of the DAC is estimated on-chip. This is used to reconfigure the switching sequence to get a lower integral nonlinearity error (INL). We propose a novel technique for estimation of DNL based on a step-size measurement. This greatly reduces the linearity and dynamic range requirements of the measuring circuits. A 10-b segmented DAC, along with the associated circuits for DNL estimation and reconfiguration, was designed using 0.35-mu m CMOS technology and fabricated through Europractice. The paper includes theoretical analysis, simulation, and experimental results for the proposed technique.
引用
收藏
页码:2348 / 2357
页数:10
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