Dual-comb spectroscopy for rapid characterization of complex optical properties of solids

被引：67
|
作者：
Asahara, Akifumi [1 ,2 ]
Nishiyama, Akiko [1 ,2 ]
Yoshida, Satoru [1 ,2 ]
Kondo, Ken-ichi [1 ,2 ]
Nakajima, Yoshiaki [1 ,2 ]
Minoshima, Kaoru [1 ,2 ]
机构：
[1] Univ Electrocommun UEC, Dept Engn Sci, Grad Sch Informat & Engn, 1-5-1 Chofugaoka, Chofu, Tokyo 1828585, Japan
[2] JST, ERATO MINOSHIMA Intelligent Opt Synthesizer IOS P, 1-5-1 Chofugaoka, Chofu, Tokyo 1828585, Japan
来源：
OPTICS LETTERS | 2016年 / 41卷 / 21期
关键词：
FREQUENCY-COMB; LASER;
D O I：
10.1364/OL.41.004971
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We demonstrate rapid characterization of complex optical properties of solids via dual-comb spectroscopy (DCS) in the near- infrared region. The fine spectral structures in the complex refractive index of an Er:YAG are successfully deduced using the developed system and Fourier analysis. Moreover, simultaneous determination of the refractive index and the thickness is demonstrated for a silicon semiconductor wafer through the use of multireflected echo signals. The results indicate the potential of DCS as a powerful measurement tool for the rapid and full characterization of solid materials. (C) 2016 Optical Society of America
引用
收藏
页码：4971 / 4974
页数：4
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