Evaluation of the holographic parameters by electrosynthesized CdXZn1-XS (X=0.3) thin films using double exposure digital holographic interferometry technique

被引：11

作者：

Dhaygude, H. D. ^{[1
]}

Chikode, P. P. ^{[2
]}

Shinde, S. K. ^{[3
]}

Shinde, N. S. ^{[4
]}

Fulari, V. J. ^{[1
]}

机构：

[1] Shivaji Univ, Dept Phys, Holog & Mat Res Lab, Kolhapur 416004, MH, India

[2] Jaysingpur Coll, Jaysingpur, India

[3] Dongguk Univ, Dept Biol & Environm Sci, 32 Dongguk Ro,Biomed Campus, Goyang Si 410773, Gyenggi Do, South Korea

[4] KBP Coll, Urun Islampur, India

来源：

OPTICS AND LASER TECHNOLOGY | 2017年 / 88卷

关键词：

DEDHI; Electrodeposition; CdXZn1-XS thin films; Holograms; CELLS; CDSE; SE;

D O I：

10.1016/j.optlastec.2016.09.017

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In this paper, we have reported the optical non destructive technique, which uses double exposure digital holographic interferometry (DEDHI) together with simple mathematical interpretation, which instantly situates to the thickness of thin films, deposited mass, stress to substrate and fringe width for different deposition times. Here, the stainless steel substrate was exposed for different intervals of time. It is observed that the fringe width, stress to substrate changes with changing the time of deposition. This effect is due to the increase in thickness of CdxZn1-xS (X=0.3) thin films. Thus, holographic studies show sensitivity to deposition time and concentrations of solution.

引用

页码：194 / 197

页数：4

共 22 条

[21] Determination of the Diffusion Coefficient of Urea Solution Using Double Exposure Digital Holographic Interferometry (DEDHI) to Study Plant Growth
Chikode, Prashant P.
Sabale, Sandip R.
Vhatkar, Rajiv S.
Fulari, Vijay J.
OPTICS AND SPECTROSCOPY, 2021, 129 (03) : 303 - 308
[22] Surface Deformation Study of the Electrodeposited Nanostructured Bi2Te3 and Sb2Te3 Thin Films by Double-Exposure Digital Holographic Interferometry
Thorat, Jayavant B.
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2019, 216 (20):

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