Numerical study of the growth conditions in an MOCVD reactor:: application to the epitaxial growth of HgTe

被引:4
|
作者
Tena-Zaera, R [1 ]
Mora-Seró, I [1 ]
Martínez-Tomás, C [1 ]
Muñoz-Sanjosé, V [1 ]
机构
[1] Univ Valencia, Dept Fis Aplicada, Inst Ciencia Mat, ICMUV, E-46100 Burjassot, Spain
关键词
computer simulation; metal-organic chemical vapor deposition; metalorganic vapor phase epitaxy; organometallic vapor phase epitaxy; mercury telluride; semiconducting II-VI materials;
D O I
10.1016/S0022-0248(02)00919-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In order to analyse the epitaxial growth by metalorganic chemical vapour deposition (MOCVD) of mercury telluride, HgTe, a 2D numerical model has been developed to simulate the gas flow in a horizontal MOCVD reactor. This model takes into account the Navier-Stokes equations coupled with the heat transfer and mass transport of chemical species. For the mathematical resolution of the governing equations a commercial solver, which can be run in a conventional personal computer, has been used. The study carried out presents a discussion about the dominant growth regime in a MOCVD growth as a function of different parameters: substrate temperature, total flow, partial pressure of precursors and reactor pressure. Emphasis is made on the fact that the substrate temperature is not the only parameter, which determines the growth regime. The use of two inlets, one for the Te precursor and the other for the mercury has been analysed in the framework of the numerical simulation. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:124 / 134
页数:11
相关论文
共 50 条
  • [11] Epitaxial growth of BGaAs and BGaInAs by MOCVD
    Geisz, JF
    Friedman, DJ
    Kurtz, S
    Olson, JM
    Swartzlander, AB
    Reedy, RC
    Norman, AG
    JOURNAL OF CRYSTAL GROWTH, 2001, 225 (2-4) : 372 - 376
  • [12] Epitaxial Growth of BGaN Films by MOCVD
    Cao Y.
    Yu J.-Q.
    Zhang L.-D.
    Deng G.-Q.
    Zhang Y.-T.
    Zhang B.-L.
    Faguang Xuebao/Chinese Journal of Luminescence, 2020, 41 (04): : 357 - 363
  • [13] Numerical analysis of titanium dioxide growth by MOCVD in an inverted vertical reactor
    Nami, Z
    Misman, O
    Erbil, A
    May, GS
    PROCESSING AND FABRICATION OF ADVANCED MATERIALS V, 1996, : 499 - 511
  • [14] MOCVD GROWTH OF CDTE AND HGTE ON GAAS IN A VERTICAL, HIGH-SPEED, ROTATING-DISK REACTOR
    TOMPA, GS
    NELSON, CR
    REINERT, PD
    SARACINO, MA
    TERRILL, LA
    COLTER, PC
    III-V HETEROSTRUCTURES FOR ELECTRONIC / PHOTONIC DEVICES, 1989, 145 : 447 - 452
  • [15] Transport Phenomena in a Novel Large MOCVD Reactor for Epitaxial Growth of GaN Thin Films
    Yang, Lianqiao
    Chen, Zunmiao
    Zhang, Jianhua
    Li, Alan G.
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2012, 25 (01) : 16 - 18
  • [16] Numerical simulations of epitaxial growth in MOVPE reactor as a tool for aluminum nitride growth optimization
    Skibinski, Jakub
    Caban, Piotr
    Wejrzanowski, Tomasz
    Grybczuk, Mateusz
    Kurzydlowski, Krzysztof J.
    JOURNAL OF POWER TECHNOLOGIES, 2016, 96 (02): : 110 - 114
  • [17] PHOTO-MOCVD GROWTH OF HGTE-CDTE SUPERLATTICES
    AHLGREN, WL
    SMITH, EJ
    JAMES, JB
    JAMES, TW
    RUTH, RP
    PATTEN, EA
    KNOX, RD
    STAUDENMANN, JL
    JOURNAL OF CRYSTAL GROWTH, 1988, 86 (1-4) : 198 - 209
  • [18] Simulation of the MOCVD reactor for ZnO growth
    Liu, SM
    Gu, SL
    Qin, F
    Zhu, SM
    Ye, JD
    Liu, W
    Zhou, X
    Zhang, R
    Shi, Y
    Zheng, YD
    PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, PTS 1-5, 2005, 475-479 : 1833 - 1836
  • [19] Numerical Study of AlN Growth in MOCVD Heated by Induction
    Lu, Ligen
    Li, Zhiming
    Zhao, Lili
    Guo, Runqiu
    Feng, Lansheng
    2019 5TH INTERNATIONAL CONFERENCE ON ENERGY MATERIALS AND ENVIRONMENT ENGINEERING, 2019, 295
  • [20] Mechanisms of molecular beam epitaxial growth of (001) HgTe
    Oehling, S
    Ehinger, M
    Spahn, W
    Waag, A
    Becker, CR
    Landwehr, G
    JOURNAL OF APPLIED PHYSICS, 1996, 79 (02) : 748 - 751