Structural phase progression in photo-excited VO2

被引：0

作者：

Zhu, Yi ^{[1
]}

Cai, Zhonghou ^{[1
]}

Chen, Pice ^{[2
]}

Zhang, Qingteng ^{[2
]}

Highland, Matthew J. ^{[3
]}

Jung, Il Woong ^{[4
]}

Walko, Donald A. ^{[1
]}

Dufresne, Eric M. ^{[1
]}

Jeong, Jaewoo ^{[5
]}

Samant, Mahesh G. ^{[5
]}

Parkins, Stuart S. P. ^{[5
,6
]}

Freeland, John W. ^{[1
]}

Evans, Paul G. ^{[2
]}

Wen, Haidan ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[2] Univ Wisconsin, Dept Mat Sci & Engn, Madison, WI 53706 USA

[3] Argonne Natl Lab, Div Sci Mat, Argonne, IL 60439 USA

[4] Argonne Natl Lab, Ctr Nanoscate Mat, Argonne, IL 60439 USA

[5] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA

[6] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany

来源：

2016 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2016年

关键词：

METAL-INSULATOR TRANSITIONS; ELECTRON-DIFFRACTION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We reveal inhomogeneous structural phase transformation in photo-excited VO2 thin films by time-resolved x-ray diffraction microscopy. The in-plane plane phase progression is a result of displacive lattice transformation rather than driven by thermal transport.

引用

页数：2

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