Optical techniques to evaluate shield/insulation interfaces in XLPE cables

被引：0
|
作者：
Braun, JM [1 ]
Densley, J [1 ]
McNabb, S [1 ]
Peralta, S [1 ]
Younsi, A [1 ]
机构：
[1] ONTARIO HYDRO TECHNOL,TORONTO,ON,CANADA
来源：
CONFERENCE RECORD OF THE 1996 IEEE INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATION, VOLS 1 AND 2 | 1996年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：151 / 154
页数：4
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