Spectrally encoded slit confocal microscopy

被引：27
|
作者：
Kim, Jeongmin [1 ]
Kang, DongKyun [1 ]
Gweon, DaeGab [1 ]
机构：
[1] Korea Adv Inst Sci & Technol, Nano Optomechatron Lab, Dept Mech Engn, Taejon 305701, South Korea
来源：
OPTICS LETTERS | 2006年 / 31卷 / 11期
关键词：
D O I：
10.1364/OL.31.001687
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A simple and cost-effective method for real-time imaging in confocal microscopy is proposed. Spectrally encoded slit confocal microscopy (SESCoM) uses a spectral encoding technique together with a confocal slit aperture to achieve two-dimensional images. Simulation and experimental results of the SESCoM's axial and lateral performances are presented. The measured FWHM of the axial response is 1.15 mu m when an objective with a NA of 0.95 is used. FWHMs of the lateral line spread functions are measured to be 236 and 244 nm along the x and y directions, respectively. Both the axial and the lateral experimental results agree well with the simulation results. (c) 2006 Optical Society of America
引用
收藏
页码：1687 / 1689
页数：3
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