共 50 条
- [34] QUANTITATIVE STUDY OF METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR DAMAGE-INDUCED BY SCANNING TUNNELING MICROSCOPE LITHOGRAPHY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3731 - 3734
- [35] Edge transistor elimination in oxide trench isolated N-channel metal-oxide-semiconductor field effect transistors JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (02): : 327 - 332
- [36] Temperature effects of γ-irradiated metal-oxide-semiconductor field-effect-transistor Wuli Xuebao/Acta Physica Sinica, 2000, 49 (07):
- [40] Two-dimensional carrier profiling on operating Si metal-oxide semiconductor field-effect transistor by scanning capacitance microscopy JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2006, 24 (03): : 1371 - 1376