Molecular Orientation in Octanedithiol and Hexadecanethiol Monolayers on GaAs and Au Measured by Infrared Spectroscopic Ellipsometry

被引:31
|
作者
Rosu, Dana M. [1 ]
Jones, Jason C. [2 ]
Hsu, Julia W. P. [2 ]
Kavanagh, Karen L. [3 ]
Tsankov, Dimiter [4 ]
Schade, Ulrich [5 ]
Esser, Norbert [1 ]
Hinrichs, Karsten [1 ]
机构
[1] ISAS Inst Analyt Sci, Dept Berlin, D-12489 Berlin, Germany
[2] Sandia Natl Labs, Albuquerque, NM 87185 USA
[3] Simon Fraser Univ, Dept Phys, Burnaby, BC V5A 1S6, Canada
[4] Bulgarian Acad Sci, Inst Organ Chem, BG-1113 Sofia, Bulgaria
[5] Berliner Elektronenspeicherring Gesell Synchrotro, D-12489 Berlin, Germany
关键词
SELF-ASSEMBLED MONOLAYERS; BARE SEMICONDUCTOR SURFACES; N-ALKANETHIOLATE MONOLAYERS; CHAIN-LENGTH DEPENDENCE; WETTING PROPERTIES; HOMOLOGOUS SERIES; ORGANIC FILMS; GOLD;
D O I
10.1021/la8026557
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Infrared spectroscopic ellipsometry was used for determination of molecular orientation and for lateral homogeneity studies of organic monolayers on GaAs and Au, the organic layer being either octanedithiol or hexadecanethiol (HDT). The laterally resolved measurements were performed with the infrared mapping ellipsometer at the synchrotron storage ring BESSY II. The molecular orientation within the monolayers was determined by optical model simulations of the measured ellipsometric spectra. Different tilt angles were obtained for the monolayers of HDT and octanedithiol on GaAs: 19 degrees and > 30 degrees, respectively. The tilt angle of the methylene chains for HDT on Au substrate (22 degrees) is similar to the 190 tilt which was obtained for the HDT monolayers on GaAs, thus suggesting similar molecular ordering of the thiolates on both substrates.
引用
收藏
页码:919 / 923
页数:5
相关论文
共 50 条
  • [41] A new approach to the IR spectroscopic study of molecular orientation and packing in adsorbed monolayers. Orientation and packing of long-chain primary amines and alcohols on quartz
    Chernyshova, IV
    Rao, KH
    JOURNAL OF PHYSICAL CHEMISTRY B, 2001, 105 (04): : 810 - 820
  • [42] Infrared spectroscopic studies on the molecular orientation of vacuum-deposited thin films of poly(dimethylsilane) and a linear oligosilane
    Shimomura, M
    Okumoto, H
    Kaito, A
    Ueno, K
    Shen, JS
    Ito, K
    MACROMOLECULES, 1998, 31 (21) : 7483 - 7487
  • [43] Real-time monitoring by spectroscopic ellipsometry and desorption mass spectroscopy during molecular beam epitaxy of AlGaAs/GaAs at high substrate temperatures
    Taferner, WT
    Mahalingam, K
    Dorsey, DL
    Eyink, KG
    IN SITU PROCESS DIAGNOSTICS AND MODELLING, 1999, 569 : 107 - 112
  • [44] Long-wavelength dielectric properties and infrared active optical phonon modes of molecular beam epitaxy ScxAl1-xN determined by infrared spectroscopic ellipsometry
    Mock, Alyssa L.
    Jacobs, Alan G.
    Jin, Eric N.
    Hardy, Matthew T.
    Tadjer, Marko J.
    APPLIED PHYSICS LETTERS, 2020, 117 (23)
  • [45] HgCdTe composition determination using spectroscopic ellipsometry during molecular beam epitaxy growth of near-infrared avalanche photodiode device structures
    T. J. De Lyon
    G. L. Olson
    J. A. Roth
    J. E. Jensen
    A. T. Hunter
    M. D. Jack
    S. L. Bailey
    Journal of Electronic Materials, 2002, 31 : 688 - 693
  • [46] HgCdTe composition determination using spectroscopic ellipsometry during molecular beam epitaxy growth of near-infrared avalanche photodiode device structures
    De Lyon, TJ
    Olson, GL
    Roth, JA
    Jensen, JE
    Hunter, AT
    Jack, MD
    Bailey, SL
    JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (07) : 688 - 693
  • [48] Characterization of molecular organization in pentacene thin films on SiO2 surface using infrared spectroscopy, spectroscopic ellipsometry, and atomic force microscopy
    Fratczak, E. Z.
    Uznanski, P.
    Moneta, M. E.
    CHEMICAL PHYSICS, 2015, 456 : 49 - 56
  • [49] Anisotropic optical properties and molecular orientation in vacuum-deposited ter(9,9-diarylfluorene)s thin films using spectroscopic ellipsometry
    Lin, HW
    Lin, CL
    Chang, HH
    Lin, YT
    Wu, CC
    Chen, YM
    Chen, RT
    Chien, YY
    Wong, KT
    JOURNAL OF APPLIED PHYSICS, 2004, 95 (03) : 881 - 886
  • [50] Infrared-visible sum frequency generation spectroscopic study of molecular orientation at polystyrene/comb-polymer interfaces
    Harp, GP
    Rangwalla, H
    Yeganeh, MS
    Dhinojwala, A
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2003, 125 (37) : 11283 - 11290