Evolution of etched nuclear track profiles of alpha particles in CR-39 by atomic force microscopy

被引：15
|
作者：
Felix-Bautista, R. [1 ]
Hernandez-Hernandez, C. [1 ]
Zendejas-Leal, B. E. [2 ]
Fragoso, R. [2 ]
Golzarri, J. I. [3 ]
Vazquez-Lopez, C. [2 ]
Espinosa, G. [3 ]
机构：
[1] Univ Nacl Autonoma Mexico, Mexico City 01000, DF, Mexico
[2] Ctr Invest & Estudios Avanzados Inst Politecn Nac, Dept Fis, Mexico City 07360, DF, Mexico
[3] Univ Nacl Autonoma Mexico IFUNAM, Inst Fis, Mexico City 01000, DF, Mexico
来源：
RADIATION MEASUREMENTS | 2013年 / 50卷
关键词：
Etched nuclear track profiles; CR-39; Atomic force microscope (AFM); Etched nuclear track simulation; Etched nuclear track evolution; CONFOCAL MICROSCOPY; PARAMETERS; DETECTOR; IONS;
D O I：
10.1016/j.radmeas.2013.01.002
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
A series of atomic force microscopy (AFM) images of etched nuclear tracks has been obtained and used to calculate the nuclear track registration sensitivity parameter V(x) = Vt(x)/Vb. Due to the AFM limitations the samples were irradiated normally to the surface, and with energies attenuated in order to include the Bragg peak region in the AFM piezo-scanner z movement range. The simulation of the track profile evolution was then obtained. The different stages of etched nuclear track profiles were rendered. (c) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码：197 / 200
页数：4
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