Single-event upsets in the Cluster and Double Star Digital Wave Processor instruments

Radiation-induced upsets are an important issue for electronic circuits operating in space. Upsets due to solar protons, trapped protons, and galactic cosmic rays are frequently observed. Modeling the expected frequency of upsets is a necessary part of the design process for space hardware. The Cluster and Double Star spacecraft were respectively European and Chinese missions dedicated to the study of the wave and particle environment in the Earth's magnetosphere. All four Cluster spacecraft and one Double Star spacecraft included a Digital Wave Processor (DWP) instrument. The primary purpose of this instrument was as the central controller of the Wave Experiment Consortium. This paper investigates the occurrence of radiation-induced single-event upsets in these DWP instruments. The memory devices used in the DWP were not specifically radiation-hardened parts and so are relatively sensitive to single-event effects. We present the experience gained during the first 11 years of operation of the Cluster mission and the nearly 4 year lifetime of the Double Star TC-1 spacecraft and compare with models of the radiation environment.