X-Ray Interference by Nanocrystalline Domains

被引:5
|
作者
Gelisio, Luca [1 ]
Scardi, Paolo [1 ]
机构
[1] Univ Trent, Dept Mat Engn & Ind Technol, I-38123 Trento, Italy
关键词
Interference; Nanosized Metallic Clusters; Debye Scattering Equation; Correlation Length; AL-N; DIFFRACTION; SCATTERING; COHERENCE; DISORDER;
D O I
10.1166/jnn.2012.6479
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Regular arrangement of nanocrystalline domains can introduce interference effects which alter considerably the powder diffraction pattern. Role of nanocrystal alignment (local texture) and mutual positioning are different, with the latter much more effective in controlling the interference effect. While it is demonstrated that these effects are unlikely to be observed on a conventional laboratory instrument, coherence conditions available at modern synchrotron radiation beamlines might support further investigations of interference in systems made of very fine nanocrystals.
引用
收藏
页码:8811 / 8817
页数:7
相关论文
共 50 条
  • [41] Developments at SSRF in soft X-ray interference lithography
    杨树敏
    王连升
    赵俊
    薛超凡
    刘海岗
    许子建
    吴衍青
    邰仁忠
    Nuclear Science and Techniques, 2015, 26 (01) : 5 - 11
  • [42] X-ray diffraction tomography using interference effects
    Universidade do Estado do Rio de, Janeiro, Rio de Janeiro, Brazil
    Nucl Instrum Methods Phys Res Sect A, 2-3 (458-464):
  • [43] ANALYTICAL REPRESENTATION OF COMPONENTS OF X-RAY INTERFERENCE LINES
    MOROZ, IA
    BURKOVSKAYA, LL
    INOZEMTSEV, OI
    INDUSTRIAL LABORATORY, 1981, 47 (10): : 1013 - 1015
  • [44] X-RAY INTERFERENCE MEASUREMENTS OF ULTRATHIN SEMICONDUCTOR LAYERS
    WIE, CR
    III-V HETEROSTRUCTURES FOR ELECTRONIC / PHOTONIC DEVICES, 1989, 145 : 467 - 473
  • [45] Characterization of nanocrystalline materials by X-ray line profile analysis
    Tamás Ungár
    Journal of Materials Science, 2007, 42 : 1584 - 1593
  • [46] X-ray scattering studies of amorphous and nanocrystalline pharmaceutical materials
    Martinez-Juarez, Javier
    Portillo-Moreno, Oscar
    Chavez-Portillo, Melissa
    Diaz-Reyes, Joel
    Lozada-Morales, Rosendo
    Juarez-Diaz, Gabriel
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2011, 67 : C325 - C325
  • [47] COMPTON SCATTERING INTERFERENCE IN FLUORESCENT X-RAY SPECTROSCOPY
    BROOKS, EJ
    BIRKS, LS
    ANALYTICAL CHEMISTRY, 1957, 29 (10) : 1556 - 1556
  • [48] Developments at SSRF in soft X-ray interference lithography
    Yang Shu-Min
    Wang Lian-Sheng
    Zhao Jun
    Xue Chao-Fan
    Liu Hai-Gang
    Xu Zi-Jian
    Wu Yan-Qing
    Tai Ren-Zhong
    NUCLEAR SCIENCE AND TECHNIQUES, 2015, 26 (01) : 5 - 11
  • [49] X-ray diffraction tomography using interference effects
    Barroso, RC
    Lopes, RT
    Goncalves, OD
    de Assis, JT
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1998, 418 (2-3): : 458 - 464
  • [50] DEFLECTION AND INTERFERENCE FRINGES OF X-RAY WAVE FIELDS
    LEHMANN, K
    BORRMANN, G
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1967, 125 (1-6): : 234 - +