Correlated Rare Failure Analysis via Asymptotic Probability Evaluation

被引:1
|
作者
Tao, Jun [1 ]
Yu, Handi [1 ]
Zhou, Dian [1 ,2 ]
Su, Yangfeng [3 ]
Zeng, Xuan [1 ]
Li, Xin [4 ,5 ]
机构
[1] Fudan Univ, Dept Microelect, ASIC & Syst State Key Lab, Shanghai, Peoples R China
[2] Univ Texas Dallas, Dept EE, Dallas, TX USA
[3] Fudan Univ, Sch Math Sci, Shanghai, Peoples R China
[4] Duke Univ, Dept ECE, Durham, NC USA
[5] Duke Kunshan Univ, Inst Appl Phys Sci & Engn, Kunshan, Peoples R China
来源
PROCEEDINGS OF THE 2017 54TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC) | 2017年
基金
中国国家自然科学基金; 美国国家科学基金会;
关键词
EVENTS; DESIGN; CMOS;
D O I
10.1145/3061639.3062217
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, a novel Asymptotic Probability Estimation (APE) method is proposed to estimate the probability of correlated rare failure events for complex integrated systems containing a large number of replicated cells. The key idea is to approximate the failure rate of the entire system by solving a set of nonlinear equations derived from a general analytical model. An error refinement method based on Look-up Table (LUT) is further developed to improve numerical stability and, hence, reduce estimation error. Our numerical experiments demonstrate that compared to the state-of-the-art method, APE can reduce the estimation error by up to 45x without increasing the computational cost.
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页数:6
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