共 50 条
- [41] 1/f noise, hydrogen transport, and latent interface-trap buildup in irradiated MOS devices IEEE Trans Nucl Sci, 6 pt 1 (1810-1817):
- [46] A charge injection based CMOS charge-pump ICECS 2003: PROCEEDINGS OF THE 2003 10TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS 1-3, 2003, : 583 - 586
- [49] Memcapacitor Based Charge Pump 2017 6TH INTERNATIONAL CONFERENCE ON MODERN CIRCUITS AND SYSTEMS TECHNOLOGIES (MOCAST), 2017,
- [50] EFFECT OF INTERFACE ON SUBBAND STRUCTURE OF MOS CHARGE LAYER BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 327 - 327