Multi-wafer MBE grown InP-based DHBTs for millimeterwave and digital applications

被引:0
|
作者
Driad, R [1 ]
Lösch, R [1 ]
Schneider, K [1 ]
Makon, RE [1 ]
Ludwig, M [1 ]
Weimann, G [1 ]
机构
[1] Fraunhofer Inst Appl Solid State Phys, Tullastr 72, D-79108 Freiburg, Germany
关键词
D O I
10.1002/pssc.200564102
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we report the development and performance of a complete InP-based DHBT manufacturable technology from material growth to device and integrated circuits realizations. The InGaAs/InP DHBTs were grown in a multi-wafer solid phosphorus MBE system. High frequency devices with an effective emitter area of 4.8 mu m(2) exhibited peak f(T) and f(MAX) values of 250 and 270 GHz, respectively, at a collector current density of similar to 4 mA/mu m(2). Using this technology, distributed amplifiers and low power consumption selectors, have been successfully fabricated and tested above 80 Gbit/s. (c) 2006 WILEY-VCH Verlag GmbH & Co KGaA, Weinheim.
引用
收藏
页码:456 / +
页数:3
相关论文
共 50 条
  • [1] Millimeterwave and digital applications of InP-based MBE grown HEMTs and HBTs
    Greiling, Paul
    Journal of Crystal Growth, 1997, 175-176 (pt 1): : 8 - 12
  • [2] Millimeterwave and digital applications of InP-based MBE grown HEMTs and HBTs
    Greiling, P
    JOURNAL OF CRYSTAL GROWTH, 1997, 175 : 8 - 12
  • [3] Solid source MBE growth on InP-based DHBTs for high-speed data communication
    Aidam, R.
    Loesch, R.
    Driad, R.
    Schneider, K.
    Makon, R.
    JOURNAL OF CRYSTAL GROWTH, 2007, 301 (SPEC. ISS.) : 1001 - 1004
  • [4] InP-based DHBTs form frequency multiplier
    不详
    MICROWAVES & RF, 1996, 35 (10) : 56 - 56
  • [5] Multi-wafer Growth of GaInAs Photodetectors on 4" InP by MOCVD for SWIR Imaging Applications
    Furlong, Mark J.
    Mattingley, Mark
    Lim, Sung Wook
    Geen, Matthew
    Jones, Wynne
    QUANTUM SENSING AND NANOPHOTONIC DEVICES XI, 2014, 8993
  • [6] Multi-wafer growth of GaInAs photodetectors on 4" InP by MOCVD for SWIR imaging applications
    Furlong, Mark J.
    Mattingley, Mark
    Lim, Sung Wook
    Geen, Matthew
    Jones, Wynne
    INFRARED TECHNOLOGY AND APPLICATIONS XL, 2014, 9070
  • [7] 60-GHZ ALINAS/GAINAS/INP DHBTS GROWN BY MOVPE + MBE
    STANCHINA, WE
    METZGER, RA
    LIU, T
    LOU, PF
    JENSEN, JF
    PIERCE, MW
    MCCRAY, LG
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (12) : 2720 - 2720
  • [8] Design elements affecting wafer temperature uniformity in multi-wafer production MBE systems
    Rogers, T. J.
    Shelton, W. A.
    Conroy, C.
    JOURNAL OF CRYSTAL GROWTH, 2009, 311 (07) : 1676 - 1679
  • [9] Multi-wafer focusing neutron monochromators and applications
    Popovici, N
    Stoica, A
    Hubbard, C
    Spooner, S
    Prask, H
    Gnaeupel-Herold, T
    Gehring, P
    Erwin, R
    NEUTRON OPTICS, 2001, 4509 : 21 - 32
  • [10] Comparison of on-wafer calibrations for THz InP-based PHEMTs applications
    Wang Zhiming
    Huang Hui
    Hu Zhifu
    Zhao Zhuobin
    Wang Xudong
    Luo Xiaobin
    Liu Jun
    Yang Songyuan
    Lu Xin
    JOURNAL OF SEMICONDUCTORS, 2015, 36 (06)