Characterizing Artefact Standards for Use with Coaxial Vector Network Analyzers at Millimeter-wave Frequencies

被引:0
|
作者
Shelton, Dexter [1 ,2 ]
Salter, Martin [2 ]
Ridler, Nick [2 ]
Horibe, Masahiro [3 ]
机构
[1] USA, Primary Stand Lab, Redstone Arsenal, AL 59257 USA
[2] Nat Phys Lab, Teddington, Middx, England
[3] Nat Metrol Inst Japan, Tsukuba, Ibaraki, Japan
关键词
Measurement standards; metrology; microwave measurements; millimeter wave measurements; transmission line measurements;
D O I
暂无
中图分类号
TN [电子技术、通信技术];
学科分类号
0809 ;
摘要
Traceability for vector network analyzer (VNA) measurements in coaxial lines smaller than 2.4 mm is problematic. The common method for traceability is to use precision coaxial air lines as primary standards. Since slotless lines are not commercially available in lines of this size, the air lines used are difficult to connect, extremely delicate, and expensive to replace. This paper describes a method of characterizing artefacts to use as standards, including specially designed and manufactured air-dielectric shielded open-circuits of various offset lengths as well as offset short-circuits and well-matched loads available in commercial VNA calibration kits. This will provide traceability using more robust and easier to use standards for calibration of the VNA. The proposed method is illustrated by measurement results obtained in 1.85 mm coaxial line (to 65 GHz.)
引用
收藏
页数:6
相关论文
共 50 条
  • [41] Technology for emerging commercial applications at millimeter-wave frequencies
    Emrick, R
    Franson, S
    Holmes, J
    Bosco, B
    Rockwell, S
    2005 IEEE/ACES International Conference on Wireless Communications and Applied Computational Electromagnetics, 2005, : 425 - 429
  • [42] Laminated metamaterial flat lens at millimeter-wave frequencies
    Kitayama, Daisuke
    Yaita, Makoto
    Song, Ho-Jin
    OPTICS EXPRESS, 2015, 23 (18): : 23348 - 23356
  • [43] Measurement of loss in superconducting microstrip at millimeter-wave frequencies
    Gao, Jiansong
    Vayonakis, Anastasios
    Noroozian, Omid
    Zmuidzinas, Jonas
    Day, Peter K.
    Leduc, Henry G.
    LOW TEMPERATURE DETECTORS LTD 13, 2009, 1185 : 164 - +
  • [44] Full-Space Metasurface at Millimeter-Wave Frequencies
    Fernandez de Arcaya, Maria Ruiz
    Marzo, Asier
    Beruete, Miguel
    2023 17TH EUROPEAN CONFERENCE ON ANTENNAS AND PROPAGATION, EUCAP, 2023,
  • [45] YBCO SUPERCONDUCTING RING RESONATORS AT MILLIMETER-WAVE FREQUENCIES
    CHOREY, CM
    KONG, KS
    BHASIN, KB
    WARNER, JD
    ITOH, T
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (09) : 1480 - 1487
  • [46] CHARACTERIZATION OF MAGNETIC DIELECTRIC MATERIALS AT MILLIMETER-WAVE FREQUENCIES
    RACHFORD, FJ
    FORESTER, DW
    IEEE TRANSACTIONS ON MAGNETICS, 1983, 19 (05) : 1883 - 1888
  • [47] A MILLIMETER-WAVE AUTOMATIC NETWORK ANALYZER
    GIBBONI, RD
    MICROWAVE JOURNAL, 1983, 26 (07) : 137 - &
  • [48] The Challenges of Measuring Integrated Antennas at Millimeter-Wave Frequencies
    Boehm, Linus
    Boegelsack, Frank
    Hitzler, Martin
    Waldschmidt, Christian
    IEEE ANTENNAS AND PROPAGATION MAGAZINE, 2017, 59 (04) : 84 - 92
  • [49] A simple GMSK modulator for microwave and millimeter-wave frequencies
    Klymyshyn, DM
    Kumar, S
    MICROWAVE JOURNAL, 1999, 42 (02) : 88 - +