Elastic modulus measurement of multilayer metallic thin films

被引:8
|
作者
Cho, KH [1 ]
Kim, Y [1 ]
机构
[1] Chonnam Natl Univ, Dept Met Engn, Kwangju 500757, South Korea
关键词
D O I
10.1557/JMR.1999.0269
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Two- and three-layer composite models were developed using a beam vibration theory, and the models were applied for measuring Young's moduli of thin metallic films. The Gr, Ni, and Go-coated Si wafer composites (two-layer composite) and (Cr/Ti/Si) composites (three-layer composite) were produced by radio-frequency (rf) magnetron sputtering and used to test the developed models. Young's moduli of (Gr) films obtained by the three-layer composite model agree well with those of (Gr) films obtained by the two-layer composite model, considering (Ti/Si) as the one layer and (Gr) as the other layer. This suggests that moduli of multilayer films may be obtained by using a two-layer composite model repeatedly.
引用
收藏
页码:1996 / 2001
页数:6
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