Photoconductive semiconductor switch (PCSS);
the jitter time;
linear mode;
SEMICONDUCTOR SWITCHES;
D O I:
10.1109/LPT.2015.2444914
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
A jitter time test of GaAs photoconductive semiconductor switch (PCSS) with excitation laser wavelength of 1064 and 532 nm is presented. When the laser pulse energy increases from 10.0 to 165.0 mu J with 8-ns laser pulse width, the corresponding jitter time decreases from 96.4 to 86.6 ps at 1064 nm and 71.6 to 63.3 ps at 532 nm, respectively. All measurements are carried out at a constant electrode gap size of 2 mm. The analysis indicates that the jitter time is proportional to the laser absorption depth in GaAs PCSS. These findings are important for decreasing the jitter time in X-ray streak camera and other accurate synchronization systems.
机构:
Yonsei Univ, Coll Med, Dept Dermatol, Seoul, South Korea
Yonsei Univ, Coll Med, Cutaneous Biol Res Inst, Seoul, South KoreaGowoonsesang Dermatol Clin, Seoul, South Korea
Cho, S. B.
Kim, J. S.
论文数: 0引用数: 0
h-index: 0
机构:
Gowoonsesang Dermatol Clin, Seoul, South KoreaGowoonsesang Dermatol Clin, Seoul, South Korea
Kim, J. S.
Kim, M. J.
论文数: 0引用数: 0
h-index: 0
机构:
Gowoonsesang Dermatol Clin, Seoul, South KoreaGowoonsesang Dermatol Clin, Seoul, South Korea