Mechanical crosstalk between vertical and lateral piezoresponse force microscopy

被引:30
|
作者
Peter, F
Rüdiger, A
Waser, R
机构
[1] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
[2] Forschungszentrum Julich, Ctr Nanoelect Syst Informat Technol Cni, D-52425 Julich, Germany
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2006年 / 77卷 / 03期
关键词
D O I
10.1063/1.2176081
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Piezoresponse force microscopy (PFM) provides valuable insight into the inverse lateral and vertical piezoelectric effects on the nanoscale. Ideally, these contributions are separated into vertical and lateral detections of a deflected laser beam on a quadrupole diode. In contrast to the known crosstalk by a rotated diode that causes identical signals in both channels, we report on the crosstalk due to the geometrical constraints of the cantilever that is inherent to the lateral PFM. For a BaTiO3 (001) nanograin we show that the vertical response attributable to the crosstalk is 1/8th of the lateral response. From this value we deduce the actual mechanism responsible for the crosstalk. (c) 2006 American Institute of Physics.
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页数:3
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