Schottky characteristics of InAlAs grown by metal-organic chemical vapor deposition

被引:5
|
作者
Ohshima, T [1 ]
Moriguchi, H [1 ]
Shigemasa, R [1 ]
Goto, S [1 ]
Tsunotani, M [1 ]
Kimura, T [1 ]
机构
[1] Oki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, Japan
关键词
InAlAs; Schottky characteristics; MOCVD; reverse current; deep trap;
D O I
10.1143/JJAP.38.1161
中图分类号
O59 [应用物理学];
学科分类号
摘要
Schottky characteristics of InAlAs grown by metal-organic chemical vapor deposition (MOCVD) have been evaluated. InAlAs Schottky characteristics are strongly affected by MOCVD growth temperature. The reverse current of InAlAs frown at 700 degrees C is more than one order of magnitude larger than that at 750 degrees C. From deep-level transient spectroscopy (DLTS) measurements, electron traps with activation energies of 0.45, 0.33 and 0.15 eV have been observed in InAlAs grown at 700 degrees C. The results of C-V, Hall and secondary ion mass spectrometry (SIMS) measurements suggest that the trap is acceptor-type and seems to be related not to impurities but to intrinsic defects. The mechanism of the large reverse current in InAlAs frown at 700 degrees C is believed to be due to the conduction through the trap.
引用
收藏
页码:1161 / 1163
页数:3
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