Schottky characteristics of InAlAs grown by metal-organic chemical vapor deposition
被引:5
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作者:
Ohshima, T
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机构:
Oki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, JapanOki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, Japan
Ohshima, T
[1
]
Moriguchi, H
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Oki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, JapanOki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, Japan
Moriguchi, H
[1
]
Shigemasa, R
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Oki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, JapanOki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, Japan
Shigemasa, R
[1
]
Goto, S
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Oki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, JapanOki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, Japan
Goto, S
[1
]
Tsunotani, M
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Oki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, JapanOki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, Japan
Tsunotani, M
[1
]
Kimura, T
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Oki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, JapanOki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, Japan
Kimura, T
[1
]
机构:
[1] Oki Elect Ind Co Ltd, Semicond Technol Lab, Hachioji, Tokyo 1938550, Japan
InAlAs;
Schottky characteristics;
MOCVD;
reverse current;
deep trap;
D O I:
10.1143/JJAP.38.1161
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Schottky characteristics of InAlAs grown by metal-organic chemical vapor deposition (MOCVD) have been evaluated. InAlAs Schottky characteristics are strongly affected by MOCVD growth temperature. The reverse current of InAlAs frown at 700 degrees C is more than one order of magnitude larger than that at 750 degrees C. From deep-level transient spectroscopy (DLTS) measurements, electron traps with activation energies of 0.45, 0.33 and 0.15 eV have been observed in InAlAs grown at 700 degrees C. The results of C-V, Hall and secondary ion mass spectrometry (SIMS) measurements suggest that the trap is acceptor-type and seems to be related not to impurities but to intrinsic defects. The mechanism of the large reverse current in InAlAs frown at 700 degrees C is believed to be due to the conduction through the trap.
机构:
S China Normal Univ, Inst Optoelect Mat & Technol, Guangzhou 510631, Guangdong, Peoples R China
Tianjin Polytech Univ, Informat & Commun Engn Sch, Tianjin 300160, Peoples R ChinaS China Normal Univ, Inst Optoelect Mat & Technol, Guangzhou 510631, Guangdong, Peoples R China
Xing Hai-Ying
Fan Guang-Han
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S China Normal Univ, Inst Optoelect Mat & Technol, Guangzhou 510631, Guangdong, Peoples R ChinaS China Normal Univ, Inst Optoelect Mat & Technol, Guangzhou 510631, Guangdong, Peoples R China
Fan Guang-Han
Yang Xue-Lin
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机构:
Peking Univ, Res Ctr Wide Band Semicond, Beijing 100871, Peoples R ChinaS China Normal Univ, Inst Optoelect Mat & Technol, Guangzhou 510631, Guangdong, Peoples R China
Yang Xue-Lin
Zhang Guo-Yi
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机构:
Peking Univ, Res Ctr Wide Band Semicond, Beijing 100871, Peoples R ChinaS China Normal Univ, Inst Optoelect Mat & Technol, Guangzhou 510631, Guangdong, Peoples R China
机构:
Chinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R ChinaChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Ma, X. M.
Yang, X. T.
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机构:
Chinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Jilin Inst Arch & Civil Engn, Changchun, Peoples R ChinaChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Yang, X. T.
Wang, C.
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机构:
Jilin Inst Arch & Civil Engn, Changchun, Peoples R ChinaChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Wang, C.
Yang, J.
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机构:
Jilin Inst Arch & Civil Engn, Changchun, Peoples R ChinaChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Yang, J.
Gao, X. H.
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机构:
Jilin Inst Arch & Civil Engn, Changchun, Peoples R ChinaChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Gao, X. H.
Liu, J. E.
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Chinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R ChinaChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Liu, J. E.
Jing, H.
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Chinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R ChinaChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Jing, H.
Du, G. T.
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机构:
Jilin Univ, Changchun, Peoples R ChinaChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Du, G. T.
Liu, B. Y.
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机构:
Northwestern Univ, Evanston, IL 60208 USAChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China
Liu, B. Y.
Ma, K.
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机构:
Chinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R ChinaChinese Acad Sci, Grad Sch, Changchun Inst Opt Fine Mech & Phys, Beijing 100864, Peoples R China