Investigation of degradation mechanisms of oragnic light-emitting diodes under an electrical stress

被引：0
|
作者：
Lee, Changhee [1 ]
Baek, Heume-Il
Kwak, Jeonghun
Cho, Hyunduck
机构：
[1] Seoul Natl Univ, Sch Elect Engn & Comp Sci, Seoul 151744, South Korea
来源：
IDMC'07: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2007 | 2007年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We studied degradation mechanisms of organic light-emitting diodes under a continuous electrical stress. We found that the mobility of organic layers is nearly unchanged while the electric current decreases more than two orders of magnitude under a constant voltage bias. The result suggests that the carrier transport properties of bulk organic films are quite stable but the organic/electrode interfaces are mainly responsible for the device degradation.
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页码：446 / +
页数：2
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