Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples

被引：0
|
作者：
Joo, Ki-Nam [1 ]
Kim, Seung-Woo [1 ]
机构：
[1] Korea Adv Inst Sci & Technol, Dept Mech Engn, Sci Town, Taejon, South Korea
来源：
INTERFEROMETRY XIII: TECHNIQUES AND ANALYSIS | 2006年 / 6292卷
关键词：
femtosecond pulse laser; refractive index; physical thickness; dispersive interferometry;
D O I：
10.1117/12.678461
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a new scheme of dispersive interferometry utilizing a femtosecond pulse laser for the dispersion-insensitive measurement of the refractive index of an optical material. Not only the group refractive index but also the variation of the phase refractive index with wavelength is determined without prior knowledge. Experiment results obtained from specimens of BK7 and UV silica are discussed.
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页数：9
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