XRD Analysis of Tungsten Thin Films.

被引：0

作者：

Djerdj, I. ^{[1
]}

Tonejc, A. M. ^{[1
]}

Tonejc, A. ^{[1
]}

Radic, N. ^{[2
]}

机构：

[1] Univ Zagreb, Fac Sci, Dept Phys, Zagreb 10002, Croatia

[2] Rudjer Boskovic Inst, Zagreb 10001, Croatia

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2004年 / 60卷

关键词：

Tungsten thin film; X-ray diffraction; Phase composition;

D O I：

10.1107/S0108767304095200

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

s8.m28.p14

引用

页码：S242 / S242

页数：1

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