High resolution strain measurements in highly disordered materials

被引：7

作者：

Sutton, Mark ^{[1
]}

Lhermitte, Julien R. M. ^{[2
]}

Ehrburger-Dolle, Francoise ^{[3
]}

Livet, Frederic ^{[4
]}

机构：

[1] McGill Univ, Phys Dept, Montreal, PQ H3A 2T8, Canada

[2] Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA

[3] Univ Grenoble Alpes, CNRS, LIPhy, F-38000 Grenoble, France

[4] Grenoble INP CNRS UJF, SIMaP, Boite Postale 75, F-38402 St Martin Dheres, France

来源：

PHYSICAL REVIEW RESEARCH | 2021年 / 3卷 / 01期

关键词：

SCATTERING; PARTICLES; DYNAMICS;

D O I：

10.1103/PhysRevResearch.3.013119

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, an alternate analysis of speckle x-ray diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing for strain (or flow) patterns to be inferred. This speckle tracking technique measures strain patterns with an accuracy similar to x-ray single crystal measurements but in amorphous or highly disordered materials.

引用

页数：6

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