Relation of Refractive Index to Ti-Concentration in Near-Stoichiometric Ti:LiNbO3 Waveguide

被引：5

作者：

Zhang, De-Long ^{[1
,2
]}

Han, Fang ^{[1
,2
]}

Xu, Shi-Yu ^{[1
,2
]}

Chen, Bei ^{[1
,2
]}

Hua, Ping-Rang ^{[1
,2
]}

Yu, Dao-Yin ^{[1
,2
]}

Pun, Edwin Yue-Bun ^{[3
]}

机构：

[1] Tianjin Univ, Sch Precis Instruments & Optoelect Engn, Tianjin 300072, Peoples R China

[2] Tianjin Univ, Key Lab Optoelect Informat Technol, Minist Educ, Tianjin 300072, Peoples R China

[3] City Univ Hong Kong, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 2013年 / 25卷 / 17期

基金：

高等学校博士学科点专项科研基金; 中国国家自然科学基金;

关键词：

Near-stoichiometric Ti:LiNbO3 waveguide; Ti-induced refractive index change; Ti-concentration; LINBO3; WAVELENGTH; DIFFUSION;

D O I：

10.1109/LPT.2013.2272719

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Multi-mode near-stoichiometric (NS) Ti:LiNbO3 planar waveguide was fabricated by co-work of Li-rich vapor transport equilibration and in-diffusion of Ti-film on an initially congruent LiNbO3 substrate. The Ti-concentration is profiled by secondary ion mass spectrometry. The refractive index profile is constructed from measured mode indices and correlated with the Ti-concentration profile. The results show that the index change and Ti-concentration follow an exponential relationship with a power index 0.75/0.49 for the ordinary/extraordinary ray. The relationship is different from that of either conventional congruent waveguide or homogeneously Ti-doped NS bulk material or NS waveguide fabricated by direct Ti-diffusion in an NS substrate.

引用

页码：1653 / 1655

页数：3

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