Interferometric deformation measurement using object induced dynamic phase-shifting.

被引：7
|
作者：
deLega, XC [1 ]
Jacquot, P [1 ]
机构：
[1] ETH ZURICH,LAB STRESS ANAL,CH-1015 LAUSANNE,SWITZERLAND
来源：
OPTICAL INSPECTION AND MICROMEASUREMENTS | 1996年 / 2782卷
关键词：
deformation measurement; dynamic phenomenon; phase-shifting;
D O I：
10.1117/12.250742
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：169 / 179
页数：11
相关论文
共 50 条
  • [41] Dynamic out-of-plane displacement measurement using the instantaneous analysis phase-shifting method
    Yeh, Hong-Yih
    Hsu, Ying-Kai
    Wei, An-Chi
    Lee, Ju-Yi
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2021, 27 (03): : 957 - 965
  • [42] Dynamic out-of-plane displacement measurement using the instantaneous analysis phase-shifting method
    Hong-Yih Yeh
    Ying-Kai Hsu
    An-Chi Wei
    Ju-Yi Lee
    Microsystem Technologies, 2021, 27 : 957 - 965
  • [43] Interferometric measurements of phase objects by using a simultaneous polarizing phase shifting Mach-Zehnder interferometer
    Garcia-Lechuga, Luis
    Canales-Pacheco, Benito
    Resendiz-Lopez, German
    Sausedo Solorio, Jose Manuel
    Monzalvo-Hernandez, Angel
    Islas-Islas, Juan-Manuel
    Montes-Perez, Areli
    Serrano-Garcia, David I.
    Ortega Mendoza, Jose Gabriel
    Antonio Escobar-Acevedo, Marco
    Ivan Toto-Arellano, Noel
    INTERFEROMETRY XIX, 2018, 10749
  • [44] Neutron interferometric measurement and calculations of a phase shift induced by Laue transmission
    Potocar, T.
    Zawisky, M.
    Lemmel, H.
    Springer, J.
    Suda, M.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2015, 71 : 534 - 541
  • [45] A computational phase -shifting interferometric method using a single -shot microinterferogram and its application
    Omar, E. Z.
    OPTIK, 2020, 217
  • [46] Calibration method of the phase-shifting error for the topography measurement utilizing white light interferometric microscopy
    Zhang C.
    Yuan Q.
    Zhang J.
    Ji Y.
    Gao Z.
    Yan J.
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2022, 51 (07):
  • [47] Interferometric dynamic displacement measurement using phase-modulated light along with stepwise control of operation point
    Tanaka, Yosuke
    Ueda, Kohei
    APPLIED PHYSICS EXPRESS, 2018, 11 (11)
  • [48] New approach to improve the accuracy of 3-D shape measurement of moving object using phase shifting profilometry
    Lu, Lei
    Xi, Jiangtao
    Yu, Yanguang
    Guo, Qinghua
    OPTICS EXPRESS, 2013, 21 (25): : 30610 - 30622
  • [49] Phase-shifting grating microscope with slab-tilting method for deformation measurement
    Zhao, B
    Asundi, A
    OPTICS AND LASER TECHNOLOGY, 1998, 30 (6-7): : 431 - 436
  • [50] Study of Phase-shifting Techniques in Digital Speckle Pattern Interferometry for Deformation Measurement
    Gu, G. Q.
    Wang, K. F.
    INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AN IMAGING, 2010, 1236 : 57 - 61
12345