Interferometric deformation measurement using object induced dynamic phase-shifting.

被引：7
|
作者：
deLega, XC [1 ]
Jacquot, P [1 ]
机构：
[1] ETH ZURICH,LAB STRESS ANAL,CH-1015 LAUSANNE,SWITZERLAND
来源：
OPTICAL INSPECTION AND MICROMEASUREMENTS | 1996年 / 2782卷
关键词：
deformation measurement; dynamic phenomenon; phase-shifting;
D O I：
10.1117/12.250742
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：169 / 179
页数：11
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