Buckling and mechanical instability of ZnO nanorods grown on different substrates under uniaxial compression

Mechanical instability and buckling characterization of vertically aligned single-crystal ZnO nanorods grown on different substrates including Si, SiC and sapphire (alpha-Al2O3) was done quantitatively by the nanoindentation technique. The nanorods were grown on these substrates by the vapor-liquid-solid (VLS) method. The critical load for the ZnO nanorods grown on the Si, SiC and Al2O3 substrates was found to be 188, 205 and 130 mu N, respectively. These observed critical loads were for nanorods with 280 nm diameters and 900 nm length using Si as a substrate, while the corresponding values were 330 nm, 3300 nm, and 780 nm, 3000 nm in the case of SiC and Al2O3 substrates, respectively. The corresponding buckling energies calculated from the force displacement curves were 8.46 x 10(-12), 1.158 x 10(-11) and 1.092 x 10(-11) J, respectively. Based on the Euler model for long nanorods and the J B Johnson model (which is an extension of the Euler model) for intermediate nanorods, the modulus of elasticity of a single rod was calculated for each sample. Finally, the critical buckling stress and strain were also calculated for all samples. We found that the buckling characteristic is strongly dependent on the quality, lattice mismatch and adhesion of the nanorods with the substrate.