Effect of the thin-film limit on the measurable optical properties of graphene

被引:12
|
作者
Holovsky, Jakub [1 ,2 ]
Nicolay, Sylvain [3 ]
De Wolf, Stefaan [3 ]
Ballif, Christophe [3 ]
机构
[1] Acad Sci Czech Republ, Inst Phys, Cukrovarnicka 10, Prague 16200, Czech Republic
[2] Czech Tech Univ, Fac Elect Engn, Tech 2, Prague 16627, Czech Republic
[3] EPFL, Inst Microengn IMT, Photovolta & Thin Film Elect Lab, CH-2000 Neuchatel, Switzerland
来源
SCIENTIFIC REPORTS | 2015年 / 5卷
关键词
SPECTROSCOPY; THICKNESS;
D O I
10.1038/srep15684
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The fundamental sheet conductance of graphene can be directly related to the product of its absorption coefficient, thickness and refractive index. The same can be done for graphene's fundamental opacity if the so-called thin-film limit is considered. Here, we test mathematically and experimentally the validity of this limit on graphene, as well as on thin metal and semiconductor layers. Notably, within this limit, all measurable properties depend only on the product of the absorption coefficient, thickness, and refractive index. As a direct consequence, the absorptance of graphene depends on the refractive indices of the surrounding media. This explains the difficulty in determining separately the optical constants of graphene and their widely varying values found in literature so far. Finally, our results allow an accurate estimation of the potential optical losses or gains when graphene is used for various optoelectronic applications.
引用
收藏
页数:6
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